Search Results for Testing. - Narrowed by: Electronic Library - Engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
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Pistons and engine testing
ent://SD_ILS/0/SD_ILS:199173
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Author MAHLE GmbH. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-8348-8662-0">http://dx.doi.org/10.1007/978-3-8348-8662-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nondestructive Testing of Materials and Structures
ent://SD_ILS/0/SD_ILS:335698
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Author Büyüköztürk, Oral. author. Taşdemir, Mehmet Ali. author. Güneş, Oğuz. editor. Akkaya, Yılmaz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335698.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0723-8">http://dx.doi.org/10.1007/978-94-007-0723-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multiphysical Testing of Soils and Shales
ent://SD_ILS/0/SD_ILS:333583
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Author Laloui, Lyesse. editor. Ferrari, Alessio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333583.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32492-5">http://dx.doi.org/10.1007/978-3-642-32492-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Non-destructive Testing and Repair of Pipelines
ent://SD_ILS/0/SD_ILS:402368
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Author Barkanov, Evgeny N. editor. Dumitrescu, Andrei. editor. Parinov, Ivan A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-56579-8">https://doi.org/10.1007/978-3-319-56579-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design and Testing of Digital Microfluidic Biochips
ent://SD_ILS/0/SD_ILS:331239
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Author Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331239.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0370-8">http://dx.doi.org/10.1007/978-1-4614-0370-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
ent://SD_ILS/0/SD_ILS:205032
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Author Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
ent://SD_ILS/0/SD_ILS:166351
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Author Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Finite Element Analysis for Satellite Structures Applications to Their Design, Manufacture and Testing
ent://SD_ILS/0/SD_ILS:331031
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Author Abdelal, Gasser F. author. Abuelfoutouh, Nader. author. Gad, Ahmed H. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331031.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4637-7">http://dx.doi.org/10.1007/978-1-4471-4637-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
ent://SD_ILS/0/SD_ILS:333763
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Author SAE-China. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333763.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33835-9">http://dx.doi.org/10.1007/978-3-642-33835-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II).
ent://SD_ILS/0/SD_ILS:333744
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Author SAE-China. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333744.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33738-3">http://dx.doi.org/10.1007/978-3-642-33738-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Flight Testing Results of the Closing Symposium of the German Research Initiative ComFliTe, Braunschweig, Germany, June 11th-12th, 2012
ent://SD_ILS/0/SD_ILS:334689
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Author Kroll, Norbert. editor. Radespiel, Rolf. editor. Burg, Jan Willem. editor. Sørensen, Kaare. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334689.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-38877-4">http://dx.doi.org/10.1007/978-3-642-38877-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Interlaboratory Testing and Evaluation of Bituminous Materials State-of-the-Art Report of the RILEM Technical Committee 206-ATB
ent://SD_ILS/0/SD_ILS:335888
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Author Partl, Manfred N. editor. Bahia, Hussain U. editor. Canestrari, Francesco. editor. de la Roche, Chantal. editor. Di Benedetto, Hervé. editor.<br/>Preferred Shelf Number ONLINE(335888.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-5104-0">http://dx.doi.org/10.1007/978-94-007-5104-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
ent://SD_ILS/0/SD_ILS:206228
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Author Fardis, Michael N. editor. Rakicevic, Zoran T. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-1977-4">http://dx.doi.org/10.1007/978-94-007-1977-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
ent://SD_ILS/0/SD_ILS:168463
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Author Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Split Hopkinson (Kolsky) Bar Design, Testing and Applications
ent://SD_ILS/0/SD_ILS:173034
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Author Chen, Weinong. author. Song, Bo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7982-7">http://dx.doi.org/10.1007/978-1-4419-7982-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power-Aware Testing and Test Strategies for Low Power Devices
ent://SD_ILS/0/SD_ILS:172100
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Author Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
ent://SD_ILS/0/SD_ILS:168058
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Author Farahmand, Bahram. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-95924-5">http://dx.doi.org/10.1007/978-0-387-95924-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modern Testing Techniques for Structural Systems Dynamics and Control
ent://SD_ILS/0/SD_ILS:176809
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Author Bursi, Oreste S. editor. Wagg, David. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-09445-7">http://dx.doi.org/10.1007/978-3-211-09445-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
ent://SD_ILS/0/SD_ILS:185959
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Author Grosse, Christian. editor. Ohtsu, Masayasu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-69972-9">http://dx.doi.org/10.1007/978-3-540-69972-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Soft Errors in Modern Electronic Systems
ent://SD_ILS/0/SD_ILS:172744
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Author Nicolaidis, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Methods of Concurrent Checking
ent://SD_ILS/0/SD_ILS:170162
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Author Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8420-1">http://dx.doi.org/10.1007/978-1-4020-8420-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
ent://SD_ILS/0/SD_ILS:170135
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Author Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
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Author Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
ent://SD_ILS/0/SD_ILS:165818
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Author Maichen, Wolfgang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-31419-8">http://dx.doi.org/10.1007/978-0-387-31419-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
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Author Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
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Author Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
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Author Larsson, Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Data Mining and Diagnosing IC Fails
ent://SD_ILS/0/SD_ILS:165270
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Author Huisman, Leendert M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault Diagnosis of Analog Integrated Circuits
ent://SD_ILS/0/SD_ILS:165176
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Author Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135977">http://dx.doi.org/10.1007/b135977</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sensor technologies for civil infrastructures. Volume 2, Applications in structural health monitoring
ent://SD_ILS/0/SD_ILS:355767
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Author Wang, M. L., editor. Lynch, Jerome P. (Jerome Peter), editor. Sohn, H. (Hoon), editor.<br/>Preferred Shelf Number ONLINE(355767.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781782422426">http://www.sciencedirect.com/science/book/9781782422426</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of carbon, graphite, diamond, and fullerenes properties, processing, and applications
ent://SD_ILS/0/SD_ILS:256038
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Author Pierson, Hugh O.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815513391">http://www.sciencedirect.com/science/book/9780815513391</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>