Search Results for Testing. - Narrowed by: Electronic Library - Engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300? 2024-11-15T19:55:27Z Pistons and engine testing ent://SD_ILS/0/SD_ILS:199173 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;MAHLE GmbH. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8348-8662-0">http://dx.doi.org/10.1007/978-3-8348-8662-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nondestructive Testing of Materials and Structures ent://SD_ILS/0/SD_ILS:335698 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;B&uuml;y&uuml;k&ouml;zt&uuml;rk, Oral. author.&#160;Ta&#351;demir, Mehmet Ali. author.&#160;G&uuml;ne&#351;, O&#287;uz. editor.&#160;Akkaya, Y&#305;lmaz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335698.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0723-8">http://dx.doi.org/10.1007/978-94-007-0723-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multiphysical Testing of Soils and Shales ent://SD_ILS/0/SD_ILS:333583 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Laloui, Lyesse. editor.&#160;Ferrari, Alessio. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333583.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32492-5">http://dx.doi.org/10.1007/978-3-642-32492-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Non-destructive Testing and Repair of Pipelines ent://SD_ILS/0/SD_ILS:402368 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Barkanov, Evgeny N. editor.&#160;Dumitrescu, Andrei. editor.&#160;Parinov, Ivan A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-56579-8">https://doi.org/10.1007/978-3-319-56579-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design and Testing of Digital Microfluidic Biochips ent://SD_ILS/0/SD_ILS:331239 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Zhao, Yang. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331239.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0370-8">http://dx.doi.org/10.1007/978-1-4614-0370-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault ent://SD_ILS/0/SD_ILS:205032 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Wunderlich, Hans-Joachim. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition ent://SD_ILS/0/SD_ILS:166351 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Sachdev, Manoj. editor.&#160;Gyvez, Jos&eacute; Pineda de. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Finite Element Analysis for Satellite Structures Applications to Their Design, Manufacture and Testing ent://SD_ILS/0/SD_ILS:331031 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Abdelal, Gasser F. author.&#160;Abuelfoutouh, Nader. author.&#160;Gad, Ahmed H. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331031.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4637-7">http://dx.doi.org/10.1007/978-1-4471-4637-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I). ent://SD_ILS/0/SD_ILS:333763 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;SAE-China. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333763.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33835-9">http://dx.doi.org/10.1007/978-3-642-33835-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II). ent://SD_ILS/0/SD_ILS:333744 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;SAE-China. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333744.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33738-3">http://dx.doi.org/10.1007/978-3-642-33738-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Flight Testing Results of the Closing Symposium of the German Research Initiative ComFliTe, Braunschweig, Germany, June 11th-12th, 2012 ent://SD_ILS/0/SD_ILS:334689 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Kroll, Norbert. editor.&#160;Radespiel, Rolf. editor.&#160;Burg, Jan Willem. editor.&#160;S&oslash;rensen, Kaare. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334689.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-38877-4">http://dx.doi.org/10.1007/978-3-642-38877-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Interlaboratory Testing and Evaluation of Bituminous Materials State-of-the-Art Report of the RILEM Technical Committee 206-ATB ent://SD_ILS/0/SD_ILS:335888 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Partl, Manfred N. editor.&#160;Bahia, Hussain U. editor.&#160;Canestrari, Francesco. editor.&#160;de la Roche, Chantal. editor.&#160;Di Benedetto, Herv&eacute;. editor.<br/>Preferred Shelf Number&#160;ONLINE(335888.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5104-0">http://dx.doi.org/10.1007/978-94-007-5104-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop ent://SD_ILS/0/SD_ILS:206228 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Fardis, Michael N. editor.&#160;Rakicevic, Zoran T. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-1977-4">http://dx.doi.org/10.1007/978-94-007-1977-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Split Hopkinson (Kolsky) Bar Design, Testing and Applications ent://SD_ILS/0/SD_ILS:173034 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Chen, Weinong. author.&#160;Song, Bo. author.&#160;SpringerLink (Online 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Jos&eacute; Luis Huertas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Advanced System-on-Chip Test Design and Optimization ent://SD_ILS/0/SD_ILS:165162 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Larsson, Erik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data Mining and Diagnosing IC Fails ent://SD_ILS/0/SD_ILS:165270 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Huisman, Leendert M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic 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Volume 2, Applications in structural health monitoring ent://SD_ILS/0/SD_ILS:355767 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Wang, M. L., editor.&#160;Lynch, Jerome P. (Jerome Peter), editor.&#160;Sohn, H. (Hoon), editor.<br/>Preferred Shelf Number&#160;ONLINE(355767.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781782422426">http://www.sciencedirect.com/science/book/9781782422426</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of carbon, graphite, diamond, and fullerenes properties, processing, and applications ent://SD_ILS/0/SD_ILS:256038 2024-11-15T19:55:27Z 2024-11-15T19:55:27Z Author&#160;Pierson, Hugh O.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815513391">http://www.sciencedirect.com/science/book/9780815513391</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>