Search Results for Testing. - Narrowed by: 1:SPRINGER SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ASPRINGER$0025091$00253ASPRINGER$0026ic$003dtrue$0026ps$003d300?dt=list 2026-03-29T17:34:14Z Dynamic Endocrine Testing ent://SD_ILS/0/SD_ILS:607387 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Sch&auml;ffler, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-662-70260-4">https://doi.org/10.1007/978-3-662-70260-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mechanical Testing of Materials ent://SD_ILS/0/SD_ILS:602381 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Gdoutos, Emmanuel. author.&#160;Konsta-Gdoutos, Maria. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-45990-0">https://doi.org/10.1007/978-3-031-45990-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trends in Software Testing ent://SD_ILS/0/SD_ILS:614531 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Mohanty, Hrushikesha. editor.&#160;Mohanty, J. R. editor.&#160;Balakrishnan, Arunkumar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-1415-4">https://doi.org/10.1007/978-981-10-1415-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pistons and engine testing ent://SD_ILS/0/SD_ILS:610925 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-658-09941-1">https://doi.org/10.1007/978-3-658-09941-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical Acoustic Emission Testing ent://SD_ILS/0/SD_ILS:614433 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;The Japanese Society for Non-Destructive. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-4-431-55072-3">https://doi.org/10.1007/978-4-431-55072-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Alternatives for Dermal Toxicity Testing ent://SD_ILS/0/SD_ILS:613151 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Eskes, Chantra. editor.&#160;van Vliet, Erwin. editor.&#160;Maibach, Howard I. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-50353-0">https://doi.org/10.1007/978-3-319-50353-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Combinatorial Testing in Cloud Computing ent://SD_ILS/0/SD_ILS:611844 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Tsai, Wei-Tek. author.&#160;Qi, Guanqiu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-4481-6">https://doi.org/10.1007/978-981-10-4481-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust and Distributed Hypothesis Testing ent://SD_ILS/0/SD_ILS:617768 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;G&uuml;l, G&ouml;khan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-49286-5">https://doi.org/10.1007/978-3-319-49286-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Geopolymer Concrete Principles, Characteristics, Testing, and Applications ent://SD_ILS/0/SD_ILS:607544 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Poloju, Kiran Kumar. author.&#160;Srinivasu, Kota. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-96-2479-9">https://doi.org/10.1007/978-981-96-2479-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Attacks, Defenses and Testing for Deep Learning ent://SD_ILS/0/SD_ILS:603831 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Chen, Jinyin. author. (orcid)0000-0002-7153-2755&#160;Zhang, Ximin. author.&#160;Zheng, Haibin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-97-0425-5">https://doi.org/10.1007/978-981-97-0425-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Validation of Alternative Methods for Toxicity Testing ent://SD_ILS/0/SD_ILS:618384 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Eskes, Chantra. editor.&#160;Whelan, Maurice. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-33826-2">https://doi.org/10.1007/978-3-319-33826-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits ent://SD_ILS/0/SD_ILS:606955 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Litovski, Van&#269;o B. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-97-8257-4">https://doi.org/10.1007/978-981-97-8257-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microwave Non-Destructive Testing and Evaluation of Fibre-Reinforced Polymer Composites Principles and Applications ent://SD_ILS/0/SD_ILS:608342 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Li, Zhen. author. 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(orcid)0000-0001-5365-8445&#160;L&oacute;pez, Jos&eacute; A. editor.&#160;Angiolillo, Dominick J. editor.&#160;Page, Clive P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-96344-5">https://doi.org/10.1007/978-3-031-96344-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ElectroMagnetic Compatibility Understanding, Design, and Testing with Practical Solutions ent://SD_ILS/0/SD_ILS:601577 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Mardiguian, Michel. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-032-02688-0">https://doi.org/10.1007/978-3-032-02688-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing Software and Systems 36th IFIP WG 6.1 International Conference, ICTSS 2024, London, UK, October 30 - November 1, 2024, Proceedings ent://SD_ILS/0/SD_ILS:607016 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Men&eacute;ndez, H&eacute;ctor D. editor. 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(orcid)0000-0002-6228-1982&#160;Laloui, Lyesse. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-52773-4">https://doi.org/10.1007/978-3-319-52773-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing Software and Systems 29th IFIP WG 6.1 International Conference, ICTSS 2017, St. Petersburg, Russia, October 9-11, 2017, Proceedings ent://SD_ILS/0/SD_ILS:613532 2026-03-29T17:34:14Z 2026-03-29T17:34:14Z Author&#160;Yevtushenko, Nina. editor.&#160;Cavalli, Ana Rosa. editor.&#160;Yenig&uuml;n, H&uuml;sn&uuml;. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-67549-7">https://doi.org/10.1007/978-3-319-67549-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Topics in Modal Analysis &amp; Testing, Volume 10 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