Search Results for Testing. - Narrowed by: 2006 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-27T10:55:01Z Software testing ent://SD_ILS/0/SD_ILS:112034 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Patton, Ron.<br/>Preferred Shelf Number&#160;QA76.76.T48 P38 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Psychological testing ent://SD_ILS/0/SD_ILS:1784 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Anastasi, Anne, 1908-<br/>Preferred Shelf Number&#160;BF 431 A573 1961<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Electrophysiologic testing ent://SD_ILS/0/SD_ILS:302663 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Fogoros, Richard N.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0802/2005034908-b.html">http://catdir.loc.gov/catdir/enhancements/fy0802/2005034908-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470750681">http://dx.doi.org/10.1002/9780470750681</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physical Testing of Rubber ent://SD_ILS/0/SD_ILS:165593 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Brown, Roger. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-29012-5">http://dx.doi.org/10.1007/0-387-29012-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Alternatives to animal testing ent://SD_ILS/0/SD_ILS:343571 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Preferred Shelf Number&#160;ONLINE(343571.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1039/9781847552457">http://dx.doi.org/10.1039/9781847552457</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Psychological testing in personnel assessment ent://SD_ILS/0/SD_ILS:1816 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Miller, K. M., ed.<br/>Preferred Shelf Number&#160;BF 431 P8 1975<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Nucleic acid testing for human disease ent://SD_ILS/0/SD_ILS:275237 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Lorincz, Attila T.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420016888">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nondestructive testing of deep foundations ent://SD_ILS/0/SD_ILS:296723 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Hertlein, Bernhardt H.&#160;Davis, Allen George.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470034831">http://dx.doi.org/10.1002/0470034831</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Genetic testing care, consent, and liability ent://SD_ILS/0/SD_ILS:303045 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Sharpe, Neil F.&#160;Carter, Ronald F.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471748897">http://dx.doi.org/10.1002/0471748897</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in electronic testing : challenges and methodologies ent://SD_ILS/0/SD_ILS:119712 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Gizopoulos, Dimitris.<br/>Preferred Shelf Number&#160;TK7867 .A385 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Toxicological testing handbook principles, applications, and data interpretation ent://SD_ILS/0/SD_ILS:276097 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Jacobson-Kram, David, 1949-&#160;Keller, Kit A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420020267">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mental testing : its history, principles and applications ent://SD_ILS/0/SD_ILS:7283 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Goodenough, Florence Laura, 1886-<br/>Preferred Shelf Number&#160;BF 431 G63 1969<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> EDA for IC system design, verification, and testing ent://SD_ILS/0/SD_ILS:285753 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Scheffer, Louis Kossuth.&#160;Lavagno, Luciano, 1959-&#160;Martin, Grant (Grant Edmund)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420007947">Distributed by publisher. 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Equipment Testing Procedures Committee.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470924778">http://dx.doi.org/10.1002/9780470924778</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10412519">http://site.ebrary.com/lib/alltitles/Doc?id=10412519</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook on mechanical properties of rocks : testing techniques and results ent://SD_ILS/0/SD_ILS:47337 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Vutukuri, V. S., 1937-&#160;Lama, R. D. , ort. yaz.&#160;Saluja, S. S. , ort. yaz.<br/>Preferred Shelf Number&#160;TA 706.5 V87 1974- V.1<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~4<br/> Field Description of Coal : a symposium Org. by ASTM Committee d-5 on Coal and Coke, American Society for Testing and Materials, Ottawa, Ontario, Canada, 22-23 Sept. 1976 ent://SD_ILS/0/SD_ILS:62350 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Symposium on Field Description of Coal (1976 : Ottawa, Ont.).&#160;Dutcher, R. 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Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Formal Approaches to Software Testing and Runtime Verification First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers ent://SD_ILS/0/SD_ILS:185247 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Havelund, Klaus. editor.&#160;N&uacute;&ntilde;ez, Manuel. editor.&#160;Ro&#351;u, Grigore. editor.&#160;Wolff, Burkhart. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11940197">http://dx.doi.org/10.1007/11940197</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:183445 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Ur, Shmuel. editor.&#160;Bin, Eyal. editor.&#160;Wolfsthal, Yaron. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11678779">http://dx.doi.org/10.1007/11678779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings ent://SD_ILS/0/SD_ILS:183961 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Uyar, M. &Uuml;mit. editor.&#160;Duale, Ali Y. editor.&#160;Fecko, Mariusz A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11754008">http://dx.doi.org/10.1007/11754008</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:184062 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Grieskamp, Wolfgang. editor.&#160;Weise, Carsten. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11759744">http://dx.doi.org/10.1007/11759744</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Theory and Applications of Satisfiability Testing - SAT 2006 9th International Conference, Seattle, WA, USA, August 12-15, 2006. Proceedings ent://SD_ILS/0/SD_ILS:184496 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Biere, Armin. editor.&#160;Gomes, Carla P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11814948">http://dx.doi.org/10.1007/11814948</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern multithreading implementing, testing, and debugging multithreaded Java and C++/Pthreads/Win32 programs ent://SD_ILS/0/SD_ILS:301802 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Carver, Richard H., 1960-&#160;Tai, Kuo-Chung.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0624/2005045775-b.html">http://catdir.loc.gov/catdir/enhancements/fy0624/2005045775-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/0471744174">http://dx.doi.org/10.1002/0471744174</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Polyurethane and fire fire performance testing under real conditions ent://SD_ILS/0/SD_ILS:303381 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Prager, Franz H.&#160;Rosteck, Helmut.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527607870">http://dx.doi.org/10.1002/3527607870</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112634619">http://www3.interscience.wiley.com/cgi-bin/bookhome/112634619</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Manual of soil laboratory testing. Vol. 1, Soil classification and compaction tests ent://SD_ILS/0/SD_ILS:312903 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Head, K. 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W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780198570547.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780198570547.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Gizopoulos / Advances in ElectronicTesting ent://SD_ILS/0/SD_ILS:165642 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Gizopoulos, Dimitris. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Oscillation-Based Test in Mixed-Signal Circuits ent://SD_ILS/0/SD_ILS:169432 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;S&aacute;nchez, Gloria Huertas. author.&#160;Garc&iacute;a de la Vega, Diego V&aacute;zquez. author.&#160;Rueda, Adoraci&oacute;n Rueda. author.&#160;D&iacute;az, Jos&eacute; Luis Huertas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digital Timing Measurements From Scopes and Probes to Timing and Jitter ent://SD_ILS/0/SD_ILS:165818 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Maichen, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-31419-8">http://dx.doi.org/10.1007/978-0-387-31419-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500&trade; ent://SD_ILS/0/SD_ILS:166049 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Silva, Francisco. author.&#160;McLaurin, Teresa. author.&#160;Waayers, Tom. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> EDA for IC implementation, circuit design, and process technology ent://SD_ILS/0/SD_ILS:285713 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Scheffer, Lou.&#160;Lavagno, Luciano, 1959-&#160;Martin, Grant (Grant Edmund)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420007954">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Daniels ve Worthingham'&#305;n kas testi : manuel de&#287;erlendirme teknikleri ent://SD_ILS/0/SD_ILS:116244 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Hislop, Helen J.&#160;Montgomery, Jacqueline.&#160;&Ouml;zdin&ccedil;ler Razak, Arzu.&#160;Yeldan, &#304;pek.&#160;Demirba&#351; Bad&#305;ll&#305;, Feyza &#350;ule.<br/>Preferred Shelf Number&#160;WE 500 H674 2006<br/>Format:&#160;Books<br/>Availability&#160;Health Sciences Library~1<br/> Hazard assessment of chemicals current developments ent://SD_ILS/0/SD_ILS:251724 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Saxena, J. (Jitendra), 1944-&#160;Fisher, F. (Farley)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123124012">http://www.sciencedirect.com/science/book/9780123124012</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Language test construction and evaluation ent://SD_ILS/0/SD_ILS:84474 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Alderson, J. Charles.&#160;Clapham, Caroline, ort. yaz.&#160;Wall, Dianne, ort. yaz.<br/>Preferred Shelf Number&#160;P 53.4 A43 1995<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Comprehensive toxicology ent://SD_ILS/0/SD_ILS:77358 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Sipes, I. Glenn, ed.&#160;McQueen, Charlene A., 1947- ed.&#160;Gandolfi, A. 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(Viktor Mikha&#301;lovich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080451503">http://www.sciencedirect.com/science/book/9780080451503</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information literacy : recognising the need ent://SD_ILS/0/SD_ILS:267819 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Walton, Geoff.&#160;Pope, Alison.<br/>Preferred Shelf Number&#160;ZA3075 I545 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Biodefense research methodology and animal models ent://SD_ILS/0/SD_ILS:276017 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Swearengen, James R.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420038118">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physical modelling in geotechnics 6th ICPMG '06 : proceedings of the Sixth International Conference on Physical Modelling in Geotechnics, 6th ICPMG '06, Hong Kong, 4-6 August 2006 ent://SD_ILS/0/SD_ILS:285672 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;International Conference on Physical Modelling in Geotechnics (6th : 2006 : Hong Kong)&#160;Ng, C. W. W.&#160;Zhang, L. M. (Limin)&#160;Wang, Y. H. (Yu-Hsing)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780415889292">Distributed by publisher. 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(Ralf W.)<br/>Preferred Shelf Number&#160;WL 355 H2368 2006<br/>Format:&#160;Books<br/>Availability&#160;Health Sciences Library~1<br/> T&uuml;rkiye'de kullan&#305;lan psikolojik testlerden &ouml;rnekler : bir ba&#351;vuru kayna&#287;&#305; ent://SD_ILS/0/SD_ILS:108600 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;&Ouml;ner, Necla.<br/>Preferred Shelf Number&#160;BF 431 O2 2006 V.1<br/>Format:&#160;Books<br/>Availability&#160;Health Sciences Library~2<br/> Cardiovascular biomarkers : pathophysiology and disease management ent://SD_ILS/0/SD_ILS:111886 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Morrow, David A.<br/>Preferred Shelf Number&#160;WG 210 C2684 2006<br/>Format:&#160;Books<br/>Availability&#160;Health Sciences Library~2<br/> Passbooks for career opportunities : maintenance development program aptitude test (USPS). ent://SD_ILS/0/SD_ILS:112060 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Preferred Shelf Number&#160;HE6499 .P377 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Assessing Language through Computer Technology ent://SD_ILS/0/SD_ILS:238370 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Chapelle, Carol A..&#160;Douglas, Dan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511733116">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor material and device characterization ent://SD_ILS/0/SD_ILS:249492 2024-12-27T10:55:01Z 2024-12-27T10:55:01Z Author&#160;Schroder, Dieter K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>