Search Results for Testing. - Narrowed by: 2011SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092011$0025092011$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-27T09:12:48ZPsychological testingent://SD_ILS/0/SD_ILS:17842024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Anastasi, Anne, 1908-<br/>Preferred Shelf Number BF 431 A573 1961<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Intelligence and intelligence testingent://SD_ILS/0/SD_ILS:2662642024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Fletcher, Richard (Richard B.) Hattie, John.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780203830567">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Psychological testing in personnel assessmentent://SD_ILS/0/SD_ILS:18162024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Miller, K. M., ed.<br/>Preferred Shelf Number BF 431 P8 1975<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Tests, testing, and genuine school reforment://SD_ILS/0/SD_ILS:2804892024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Walberg, Herbert J., 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=550369">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=550369</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing complex and embedded systemsent://SD_ILS/0/SD_ILS:2888732024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Pries, Kim H., 1955- Quigley, Jon M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439821411">Distributed by publisher. 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Geo-Institute.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=442526">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=442526</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testingent://SD_ILS/0/SD_ILS:2986532024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Split Hopkinson (Kolsky) Bar Design, Testing and Applicationsent://SD_ILS/0/SD_ILS:1730342024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Chen, Weinong. author. Song, Bo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7982-7">http://dx.doi.org/10.1007/978-1-4419-7982-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnectsent://SD_ILS/0/SD_ILS:1684632024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pharmacogenomic Testing in Current Clinical Practice Implementation in the Clinical Laboratoryent://SD_ILS/0/SD_ILS:1750002024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Wu, Alan H. 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Revised Selected Papersent://SD_ILS/0/SD_ILS:1940902024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Barner, Sharon. editor. Harris, Ian. editor. Kroening, Daniel. editor. Raz, Orna. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-19583-9">http://dx.doi.org/10.1007/978-3-642-19583-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Theory and Applications of Satisfiability Testing - SAT 2011 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1947472024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Sakallah, Karem A. editor. Simon, Laurent. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-21581-0">http://dx.doi.org/10.1007/978-3-642-21581-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical Aspects of Cosmetic Testing How to Set up a Scientific Study in Skin Physiologyent://SD_ILS/0/SD_ILS:1911452024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Fluhr, Joachim. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-05067-1">http://dx.doi.org/10.1007/978-3-642-05067-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Basel II Risk Parameters Estimation, Validation, Stress Testing - with Applications to Loan Risk Managementent://SD_ILS/0/SD_ILS:1931892024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Engelmann, Bernd. editor. Rauhmeier, Robert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16114-8">http://dx.doi.org/10.1007/978-3-642-16114-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hardware and Software: Verification and Testing 5th International Haifa Verification Conference, HVC 2009, Haifa, Israel, October 19-22, 2009, Revised Selected Papersent://SD_ILS/0/SD_ILS:1939782024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Namjoshi, Kedar. editor. Zeller, Andreas. editor. Ziv, Avi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-19237-1">http://dx.doi.org/10.1007/978-3-642-19237-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Permutation Testing for Isotonic Inference on Association Studies in Geneticsent://SD_ILS/0/SD_ILS:1944222024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Salmaso, Luigi. Arboretti, Rosa. Corain, Livio. Mazzaro, Dario. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20584-2">http://dx.doi.org/10.1007/978-3-642-20584-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing Software and Systems 23rd IFIP WG 6.1 International Conference, ICTSS 2011, Paris, France, November 7-10, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1956812024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Wolff, Burkhart. editor. Zaïdi, Fatiha. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24580-0">http://dx.doi.org/10.1007/978-3-642-24580-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>LED packaging for lighting applications design, manufacturing, and testingent://SD_ILS/0/SD_ILS:2986542024-12-27T09:12:48Z2024-12-27T09:12:48ZAuthor Liu, S. (Sheng), 1963- Luo, Xiaobing, 1974-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818630">Click here to view book</a>
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