Search Results for Testing. - Narrowed by: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300?
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Contactless VLSI Measurement and Testing Techniques
ent://SD_ILS/0/SD_ILS:401142
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Author Sayil, Selahattin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design, Modeling and Testing of Data Converters
ent://SD_ILS/0/SD_ILS:487999
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Author Carbone, Paolo. editor. Kiaei, Sayfe. editor. Xu, Fang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39655-7">https://doi.org/10.1007/978-3-642-39655-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design and Testing of Digital Microfluidic Biochips
ent://SD_ILS/0/SD_ILS:331239
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Author Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331239.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0370-8">http://dx.doi.org/10.1007/978-1-4614-0370-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
ent://SD_ILS/0/SD_ILS:166351
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Author Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovative Design, Manufacturing and Testing of Small Satellites
ent://SD_ILS/0/SD_ILS:401087
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Author Madry, Scott. author. Martinez, Peter. author. Laufer, Rene. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-75094-1">https://doi.org/10.1007/978-3-319-75094-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
ent://SD_ILS/0/SD_ILS:399470
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Author Zhuang, Yuming. author. Chen, Degang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-77718-4">https://doi.org/10.1007/978-3-319-77718-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
ent://SD_ILS/0/SD_ILS:168463
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Author Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Timing Performance of Nanometer Digital Circuits Under Process Variations
ent://SD_ILS/0/SD_ILS:400723
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Author Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-75465-9">https://doi.org/10.1007/978-3-319-75465-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
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Author Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
ent://SD_ILS/0/SD_ILS:165818
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Author Maichen, Wolfgang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-31419-8">http://dx.doi.org/10.1007/978-0-387-31419-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
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Author Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
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Author Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
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Author Larsson, Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault Diagnosis of Analog Integrated Circuits
ent://SD_ILS/0/SD_ILS:165176
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Author Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135977">http://dx.doi.org/10.1007/b135977</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Data Mining and Diagnosing IC Fails
ent://SD_ILS/0/SD_ILS:165270
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Author Huisman, Leendert M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
ent://SD_ILS/0/SD_ILS:599880
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Author Arif, Tariq M., author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number Q325.73 .A75 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital convergence in antenna designs : applications for real-time solutions
ent://SD_ILS/0/SD_ILS:598939
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Author Srividya, P., editor.<br/>Preferred Shelf Number TK7871.6 .D54 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119879923">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119879923</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
ent://SD_ILS/0/SD_ILS:527384
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Author Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-16-7487-7">https://doi.org/10.1007/978-981-16-7487-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Graphene field-effect transistors : advanced bioelectronic devices for sensing applications
ent://SD_ILS/0/SD_ILS:598617
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Author Azzaroni, Omar, editor. Knoll, Wolfgang, editor.<br/>Preferred Shelf Number TK7871.95 .G73 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843374">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843374</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent IoT for the digital world : incorporating 5G communications and fog/edge computing technologies
ent://SD_ILS/0/SD_ILS:596306
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Author Yang, Yang, 1974- author.<br/>Preferred Shelf Number TK5105.8857 .Y36 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119593584">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119593584</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical connectors : design, manufacture, test, and selection
ent://SD_ILS/0/SD_ILS:596172
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Author Pecht, Michael, editor. Kyeong, San, editor.<br/>Preferred Shelf Number TK3521<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to fuzzy logic
ent://SD_ILS/0/SD_ILS:596643
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Author Peckol, James K., author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number QA9.64 .P43 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772644">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772644</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering
ent://SD_ILS/0/SD_ILS:595527
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Author Kenett, Ron, editor. Swarz, Robert S., editor. Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number TA168 .S8727 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The ESD control program handbook
ent://SD_ILS/0/SD_ILS:595961
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Author Smallwood, J. M. (Jeremy M.), author.<br/>Preferred Shelf Number TK7870<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Smart sensors for environmental and medical applications
ent://SD_ILS/0/SD_ILS:595911
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Author Hallil, Hamida, 1981- editor. Heidari, Hadi, editor.<br/>Preferred Shelf Number R857 .B54 S64 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119587422">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119587422</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used
ent://SD_ILS/0/SD_ILS:596092
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Author Domingo, George, 1937- author.<br/>Preferred Shelf Number TK7871.85 .D66 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of 3D integration. Volume 4, Design, test, and thermal management
ent://SD_ILS/0/SD_ILS:595051
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Author Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Preferred Shelf Number TK7874.893 .H36 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoelectronics : materials, devices, applications
ent://SD_ILS/0/SD_ILS:593621
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Author Puers, R., editor.<br/>Preferred Shelf Number TK7874.84<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Current Signature Analysis for Condition Monitoring of Cage Induction Motors : Industrial Application and Case Histories
ent://SD_ILS/0/SD_ILS:593199
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Author Thomson, William T. Culbert, Ian.<br/>Preferred Shelf Number TK2785<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119175476">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119175476</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014
ent://SD_ILS/0/SD_ILS:530561
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Author Maharatna, Koushik. editor. Dalapati, Goutam Kumar. editor. Banerjee, P K. editor. Mallick, Amiya Kumar. editor. Mukherjee, Moumita. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-2274-3">https://doi.org/10.1007/978-81-322-2274-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:530446
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Author Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06986-9">https://doi.org/10.1007/978-3-319-06986-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Trends in Networking, Computing, E-learning, Systems Sciences, and Engineering
ent://SD_ILS/0/SD_ILS:529406
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Author Elleithy, Khaled. editor. Sobh, Tarek. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06764-3">https://doi.org/10.1007/978-3-319-06764-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
ent://SD_ILS/0/SD_ILS:530615
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Author Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>