Search Results for Testing. - Narrowed by: Computer engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dSUBJECT$002509Subject$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ps$003d300$0026isd$003dtrue?dt=list
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Attacks, Defenses and Testing for Deep Learning
ent://SD_ILS/0/SD_ILS:603831
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Author Chen, Jinyin. author. (orcid)0000-0002-7153-2755 Zhang, Ximin. author. Zheng, Haibin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-0425-5">https://doi.org/10.1007/978-981-97-0425-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Theory and Applications of Satisfiability Testing - SAT 2017 20th International Conference, Melbourne, VIC, Australia, August 28 - September 1, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:611748
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Author Gaspers, Serge. editor. Walsh, Toby. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-66263-3">https://doi.org/10.1007/978-3-319-66263-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
ent://SD_ILS/0/SD_ILS:333763
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Author SAE-China. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333763.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33835-9">http://dx.doi.org/10.1007/978-3-642-33835-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Soft Errors in Modern Electronic Systems
ent://SD_ILS/0/SD_ILS:172744
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Author Nicolaidis, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
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Author Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605770
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Author Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-3756-7">https://doi.org/10.1007/978-981-97-3756-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605599
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Author Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-5269-0">https://doi.org/10.1007/978-981-97-5269-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Information Security, Privacy and Digital Forensics Select Proceedings of the International Conference, ICISPD 2022
ent://SD_ILS/0/SD_ILS:601918
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Author Patel, Sankita J. editor. Chaudhary, Naveen Kumar. editor. Gohil, Bhavesh N. editor. Iyengar, S. S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5091-1">https://doi.org/10.1007/978-981-99-5091-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:612752
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Author Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-66266-4">https://doi.org/10.1007/978-3-319-66266-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
SDL 2017: Model-Driven Engineering for Future Internet 18th International SDL Forum, Budapest, Hungary, October 9-11, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:613738
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Author Csöndes, Tibor. editor. Kovács, Gábor. editor. Réthy, György. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-68015-6">https://doi.org/10.1007/978-3-319-68015-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Models, Algorithms, Logics and Tools Essays Dedicated to Kim Guldstrand Larsen on the Occasion of His 60th Birthday
ent://SD_ILS/0/SD_ILS:617812
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Author Aceto, Luca. editor. Bacci, Giorgio. editor. Bacci, Giovanni. editor. Ingólfsdóttir, Anna. editor. Legay, Axel. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-63121-9">https://doi.org/10.1007/978-3-319-63121-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Concise Guide to Software Engineering From Fundamentals to Application Methods
ent://SD_ILS/0/SD_ILS:617836
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Author O'Regan, Gerard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-57750-0">https://doi.org/10.1007/978-3-319-57750-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:615981
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Author Gabmeyer, Sebastian. editor. Johnsen, Einar Broch. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-61467-0">https://doi.org/10.1007/978-3-319-61467-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital design and fabrication
ent://SD_ILS/0/SD_ILS:540504
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Author Oklobdzija, Vojin G.<br/>Preferred Shelf Number TK7885 .D54 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Computers, Software Engineering, and Digital Devices
ent://SD_ILS/0/SD_ILS:542493
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Author Dorf, Richard C., author. Taylor and Francis.<br/>Preferred Shelf Number TK7885<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Computer Engineering Handbook.
ent://SD_ILS/0/SD_ILS:543838
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Author Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Preferred Shelf Number TK7885 .C645 2002<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>