Search Results for Testing. - Narrowed by: Computer engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dSUBJECT$002509Subject$002509Computer$002bengineering.$002509Computer$002bengineering.$0026te$003dILS$0026ps$003d300?dt=list
2024-12-26T18:15:55Z
Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
ent://SD_ILS/0/SD_ILS:333763
2024-12-26T18:15:55Z
2024-12-26T18:15:55Z
Author SAE-China. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333763.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33835-9">http://dx.doi.org/10.1007/978-3-642-33835-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Soft Errors in Modern Electronic Systems
ent://SD_ILS/0/SD_ILS:172744
2024-12-26T18:15:55Z
2024-12-26T18:15:55Z
Author Nicolaidis, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-12-26T18:15:55Z
2024-12-26T18:15:55Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
2024-12-26T18:15:55Z
2024-12-26T18:15:55Z
Author Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>