Search Results for Testing. - Narrowed by: Electronic books.
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Electrophysiologic testing
ent://SD_ILS/0/SD_ILS:305152
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Author Fogoros, Richard N.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=447054">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118399613">http://dx.doi.org/10.1002/9781118399613</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gas well testing handbook
ent://SD_ILS/0/SD_ILS:254192
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Author Chaudhry, Amanat U.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677059">http://www.sciencedirect.com/science/book/9780750677059</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
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Author Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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Digital logic testing and simulation
ent://SD_ILS/0/SD_ILS:301509
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Author Miczo, Alexander.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9780471439950">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471457787">http://dx.doi.org/10.1002/0471457787</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley046/2003041100.html">http://catdir.loc.gov/catdir/bios/wiley046/2003041100.html</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9780471439950">http://proquest.tech.safaribooksonline.de/9780471439950</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
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Author Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Concrete materials properties, specifications and testing
ent://SD_ILS/0/SD_ILS:256040
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Author Popovics, Sandor, 1921-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815513087">http://www.sciencedirect.com/science/book/9780815513087</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital systems testing and testable design
ent://SD_ILS/0/SD_ILS:249585
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Author Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Frequency response testing in nuclear reactors
ent://SD_ILS/0/SD_ILS:255011
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Author Kerlin, Thomas W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124048508">http://www.sciencedirect.com/science/book/9780124048508</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical hypothesis testing with SAS and R
ent://SD_ILS/0/SD_ILS:341737
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Author Taeger, Dirk, author. Kuhnt, Sonja, author.<br/>Preferred Shelf Number ONLINE(341737.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1602290">http://public.eblib.com/choice/publicfullrecord.aspx?p=1602290</a>
ebrary <a href="http://site.ebrary.com/id/10827576">http://site.ebrary.com/id/10827576</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118762585">http://dx.doi.org/10.1002/9781118762585</a>
John Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118762585">http://onlinelibrary.wiley.com/book/10.1002/9781118762585</a>
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Formation testing : pressure transient and contamination analysis
ent://SD_ILS/0/SD_ILS:341843
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Author Chin, Wilson C., author.<br/>Preferred Shelf Number ONLINE(341843.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118831175">http://dx.doi.org/10.1002/9781118831175</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9781118831175">http://onlinelibrary.wiley.com/book/10.1002/9781118831175</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63551">http://www.books24x7.com/marc.asp?bookid=63551</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to robust estimation and hypothesis testing
ent://SD_ILS/0/SD_ILS:306655
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Author Wilcox, Rand R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123869838">http://www.sciencedirect.com/science/book/9780123869838</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Verification, validation, and testing of engineered systems
ent://SD_ILS/0/SD_ILS:298010
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Author Engel, Avner.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35180">http://www.books24x7.com/marc.asp?bookid=35180</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470618851">http://dx.doi.org/10.1002/9780470618851</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470618851">http://onlinelibrary.wiley.com/book/10.1002/9780470618851</a>
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<a href="http://proquest.safaribooksonline.com/9781118029312">http://proquest.safaribooksonline.com/9781118029312</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software error detection through testing and analysis
ent://SD_ILS/0/SD_ILS:297725
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Author Huang, J. C., 1935-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
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Fatigue testing and analysis theory and practice
ent://SD_ILS/0/SD_ILS:254179
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Author Lee, Yung-Li.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677196">http://www.sciencedirect.com/science/book/9780750677196</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Testing for EMC compliance approaches and techniques
ent://SD_ILS/0/SD_ILS:249406
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Author Montrose, Mark I. Nakauchi, Edward M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
AIChE equipment testing procedure continuous direct-heat rotary dryers : a guide to performance evaluation
ent://SD_ILS/0/SD_ILS:301212
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Author American Institute of Chemical Engineers. Equipment Testing Procedures Committee. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470924778">http://dx.doi.org/10.1002/9780470924778</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10412519">http://site.ebrary.com/lib/alltitles/Doc?id=10412519</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nonparametric hypothesis testing : rank and permutation methods with applications in R
ent://SD_ILS/0/SD_ILS:341748
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Author Bonnini, Stefano, author. Corain, Livio, author. Marozzi, Marco, author. Salmaso, Luigi, author.<br/>Preferred Shelf Number ONLINE(341748.1)<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118763483">Available by subscription from Safari Books Online</a>
ebrary <a href="http://alltitles.ebrary.com/Doc?id=10891171">http://alltitles.ebrary.com/Doc?id=10891171</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118763490">http://dx.doi.org/10.1002/9781118763490</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118763483">http://proquest.tech.safaribooksonline.de/9781118763483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
LED packaging for lighting applications design, manufacturing, and testing
ent://SD_ILS/0/SD_ILS:298654
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Author Liu, S. (Sheng), 1963- Luo, Xiaobing, 1974-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818630">Click here to view book</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470827857">http://dx.doi.org/10.1002/9780470827857</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10490643">http://site.ebrary.com/lib/alltitles/Doc?id=10490643</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software testing testing across the entire software development life cycle
ent://SD_ILS/0/SD_ILS:249509
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Author Everett, Gerald D., 1943- McLeod, Raymond. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Educational testing a competence-based approach text for the British Psychological Society's certificate of competence in educational testing (Level A)
ent://SD_ILS/0/SD_ILS:302832
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Author Boyle, James. Fisher, Stephen. British Psychological Society. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={5B87B6B6-E35F-4B1E-8361-2D2E72C379A5}&Format=50">Click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=284129">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=284129</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470774090">http://dx.doi.org/10.1002/9780470774090</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0802/2006001705-b.html">http://catdir.loc.gov/catdir/enhancements/fy0802/2006001705-b.html</a>
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Metasploit toolkit for penetration testing, exploit development, and vulnerability research
ent://SD_ILS/0/SD_ILS:306469
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Author Maynor, David. Mookhey, K. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781597490740">http://www.sciencedirect.com/science/book/9781597490740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical insulation for rotating machines design, evaluation, aging, testing, and repair
ent://SD_ILS/0/SD_ILS:249407
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Author Stone, Greg.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201844">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201844</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Unit testing in Java how tests drive the code
ent://SD_ILS/0/SD_ILS:253658
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Author Link, Johannes. Frlich, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9781558608689">http://www.sciencedirect.com/science/book/9781558608689</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated stress testing handbook guide for achieving quality products
ent://SD_ILS/0/SD_ILS:249645
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Author Chan, H. Anthony, 1952- Englert, Paul J, 1960-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Weathering of plastics testing to mirror real life performance
ent://SD_ILS/0/SD_ILS:256290
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Author Wypych, George. Society of Plastics Engineers. Plastics Design Library.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9781884207754">http://www.sciencedirect.com/science/book/9781884207754</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Hybrid microcircuit technology handbook materials, processes, design, testing and production
ent://SD_ILS/0/SD_ILS:254145
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Author Licari, James J., 1930- Enlow, Leonard R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514237">http://www.sciencedirect.com/science/book/9780815514237</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing
ent://SD_ILS/0/SD_ILS:249677
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Author Bhatnagar, P. K., 1948- IEEE Communications Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273657">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273657</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of real-time fast Fourier transforms algorithms to product testing
ent://SD_ILS/0/SD_ILS:249627
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Author Smith, Winthrop W., 1944- Smith, Joanne M., 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263057</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Positive displacement pumps a guide to performance evaluation
ent://SD_ILS/0/SD_ILS:302903
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Author American Institute of Chemical Engineers. Equipment Testing Procedures Committee.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=588826">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=588826</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470924754">http://dx.doi.org/10.1002/9780470924754</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0915/2009464096-b.html">http://catdir.loc.gov/catdir/enhancements/fy0915/2009464096-b.html</a>
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NDT data fusion
ent://SD_ILS/0/SD_ILS:254155
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Author Gros, X. E. (Xavier Emanuel), 1968-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780340676486">http://www.sciencedirect.com/science/book/9780340676486</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
An introduction to TTCN-3
ent://SD_ILS/0/SD_ILS:298792
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Author Willcock, Colin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470977903">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780470977897">Available by subscription from Safari Books Online</a>
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Wavelet neural networks : with applications in financial engineering, chaos, and classification
ent://SD_ILS/0/SD_ILS:341611
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Author Alexandridis, Antonis K., author. Zapranis, Achilleas, 1965- author.<br/>Preferred Shelf Number ONLINE(341611.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1676373">http://public.eblib.com/choice/publicfullrecord.aspx?p=1676373</a>
ebrary <a href="http://site.ebrary.com/id/10862614">http://site.ebrary.com/id/10862614</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118596272">http://dx.doi.org/10.1002/9781118596272</a>
MyiLibrary <a href="http://www.myilibrary.com?id=599751">http://www.myilibrary.com?id=599751</a>
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Current interruption transients calculation
ent://SD_ILS/0/SD_ILS:341696
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Author Peelo, David F., author.<br/>Preferred Shelf Number ONLINE(341696.1)<br/>Electronic Access <a href="http://site.ebrary.com/lib/byuprovo/docDetail.action?docID=10831323">CLICK HERE for online access</a>
<a href="http://dx.doi.org/10.1002/9781118707227">http://dx.doi.org/10.1002/9781118707227</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63509">http://www.books24x7.com/marc.asp?bookid=63509</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Signal integrity from high speed to radiofrequency applications
ent://SD_ILS/0/SD_ILS:341645
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Author Ndagijimana, Fabien.<br/>Preferred Shelf Number ONLINE(341645.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1706870">http://public.eblib.com/choice/publicfullrecord.aspx?p=1706870</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118649183">http://dx.doi.org/10.1002/9781118649183</a>
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Software architecture. 1
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Clinical trials handbook design and conduct
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Case histories in vibration analysis and metal fatigue for the practicing engineer
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Ultrasonic inspection technology development and search unit design examples of practical applications
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Handbook of microwave component measurements : with advanced VNA techniques
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Microwave imaging
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Advances in computed tomography for geomaterials GeoX 2010
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Permutation tests for complex data theory, applications, and software
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Software metrics and software metrology
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Materials and acoustics handbook
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Failure analysis of paints and coatings
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ESD failure mechanisms and models
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RF measurements for cellular phones and wireless data systems
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Automated defect prevention best practices in software management
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Advances in bioceramics and biocomposites II a collection of papers presented at the 30th International Conference on Advanced Ceramics and Composites, January 22-27, 2006, Cocoa Beach, Florida
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Author International Conference on Advanced Ceramics and Composites (30th : 2006 : Cocoa Beach, Fla.) Mizuno, Mineo. Wereszczak, Andrew. Lara-Curzio, Edgar, 1963- American Ceramic Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468705">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468705</a>
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Software measurement and estimation a practical approach
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Author Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor material and device characterization
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Psychological assessment in the workplace a manager's guide
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Multilayer thin films sequential assembly of nanocomposite materials
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Fire behavior of upholstered furniture and mattresses
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Plastics failure analysis and prevention
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Integrated circuit manufacturability the art of process and design integration
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Handbook of carbon, graphite, diamond, and fullerenes properties, processing, and applications
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