Search Results for Testing. - Narrowed by: Reliability (Engineering)
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Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
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Author Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated testing and validation testing, engineering, and management tools for lean development
ent://SD_ILS/0/SD_ILS:254184
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Author Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Viewpoints and controversies in sensory science and consumer product testing
ent://SD_ILS/0/SD_ILS:296001
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Author Moskowitz, Howard R. Muñoz, Alejandra M., 1957- Gacula, Maximo C. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability verification, testing and analysis in engineering design
ent://SD_ILS/0/SD_ILS:547339
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Author Wasserman, Gary S., 1951, author.<br/>Preferred Shelf Number TA169 .W37 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Mechanical reliability improvement : probability and statistics for experimental testing
ent://SD_ILS/0/SD_ILS:541297
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Author Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Preferred Shelf Number TA169 L778 2003<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries
ent://SD_ILS/0/SD_ILS:598326
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Author El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number TA169 .A67 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Physics-Of-Healthy in Mechatronics.
ent://SD_ILS/0/SD_ILS:598146
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Author El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Preferred Shelf Number TA169 .E515 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability culture : how leaders build organizations that create reliable products
ent://SD_ILS/0/SD_ILS:596268
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Author Bahret, Adam P., 1973- author.<br/>Preferred Shelf Number TS156 .B335 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photovoltaic module reliability
ent://SD_ILS/0/SD_ILS:595739
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Author Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering and services
ent://SD_ILS/0/SD_ILS:594657
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Author Jin, Tongdan, author.<br/>Preferred Shelf Number TS173 .J56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving product reliability and software quality : strategies, tools, process and implementation
ent://SD_ILS/0/SD_ILS:595034
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Author Levin, Mark, 1959- author. Kalal, Ted T., author. Rodin, Jonathan, 1957- author.<br/>Preferred Shelf Number TS173 .L48 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for Laboratory Quality Auditing
ent://SD_ILS/0/SD_ILS:539624
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Author Singer, author.<br/>Preferred Shelf Number R850 .S564 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781498710527">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability, quality, and safety for engineers
ent://SD_ILS/0/SD_ILS:547810
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Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TS173 .D495 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design and analysis of accelerated tests for mission critical reliability
ent://SD_ILS/0/SD_ILS:546254
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Author LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Medical device reliability and associated areas
ent://SD_ILS/0/SD_ILS:540912
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Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number R855.3 .D47 2000<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design reliability : fundamentals and applications
ent://SD_ILS/0/SD_ILS:540572
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Author Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number TA174 .D4929 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>