Search Results for Testing. - Narrowed by: System safety.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ps$003d300?dt=list
2024-11-23T19:08:18Z
Springer Handbook of Metrology and Testing
ent://SD_ILS/0/SD_ILS:193364
2024-11-23T19:08:18Z
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Author Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
ent://SD_ILS/0/SD_ILS:168463
2024-11-23T19:08:18Z
2024-11-23T19:08:18Z
Author Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
ent://SD_ILS/0/SD_ILS:185959
2024-11-23T19:08:18Z
2024-11-23T19:08:18Z
Author Grosse, Christian. editor. Ohtsu, Masayasu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-69972-9">http://dx.doi.org/10.1007/978-3-540-69972-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists
ent://SD_ILS/0/SD_ILS:166411
2024-11-23T19:08:18Z
2024-11-23T19:08:18Z
Author Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-11-23T19:08:18Z
2024-11-23T19:08:18Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>