Search Results for Testing. - Narrowed by: Systems engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesting.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ps$003d300$0026isd$003dtrue?
2025-12-24T12:59:20Z
Contactless VLSI Measurement and Testing Techniques
ent://SD_ILS/0/SD_ILS:401142
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Author Sayil, Selahattin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design and Testing of Digital Microfluidic Biochips
ent://SD_ILS/0/SD_ILS:331239
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Author Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331239.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0370-8">http://dx.doi.org/10.1007/978-1-4614-0370-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Verification, validation, and testing of engineered systems
ent://SD_ILS/0/SD_ILS:298010
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2025-12-24T12:59:20Z
Author Engel, Avner.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35180">http://www.books24x7.com/marc.asp?bookid=35180</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470618851">http://dx.doi.org/10.1002/9780470618851</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470618851">http://onlinelibrary.wiley.com/book/10.1002/9780470618851</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118029312">http://proquest.safaribooksonline.com/?fpi=9781118029312</a>
<a href="http://proquest.safaribooksonline.com/9781118029312">http://proquest.safaribooksonline.com/9781118029312</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
ent://SD_ILS/0/SD_ILS:205032
2025-12-24T12:59:20Z
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Author Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
ent://SD_ILS/0/SD_ILS:166351
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Author Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-46547-2">http://dx.doi.org/10.1007/0-387-46547-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
ent://SD_ILS/0/SD_ILS:399470
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Author Zhuang, Yuming. author. Chen, Degang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-77718-4">https://doi.org/10.1007/978-3-319-77718-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power-Aware Testing and Test Strategies for Low Power Devices
ent://SD_ILS/0/SD_ILS:172100
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Author Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Timing Performance of Nanometer Digital Circuits Under Process Variations
ent://SD_ILS/0/SD_ILS:400723
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Author Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-75465-9">https://doi.org/10.1007/978-3-319-75465-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Soft Errors in Modern Electronic Systems
ent://SD_ILS/0/SD_ILS:172744
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Author Nicolaidis, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
ent://SD_ILS/0/SD_ILS:170135
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Author Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Methods of Concurrent Checking
ent://SD_ILS/0/SD_ILS:170162
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Author Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8420-1">http://dx.doi.org/10.1007/978-1-4020-8420-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gizopoulos / Advances in ElectronicTesting
ent://SD_ILS/0/SD_ILS:165642
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Author Gizopoulos, Dimitris. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
ent://SD_ILS/0/SD_ILS:165818
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Author Maichen, Wolfgang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-31419-8">http://dx.doi.org/10.1007/978-0-387-31419-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
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Author Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
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Author Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault Diagnosis of Analog Integrated Circuits
ent://SD_ILS/0/SD_ILS:165176
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Author Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135977">http://dx.doi.org/10.1007/b135977</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Data Mining and Diagnosing IC Fails
ent://SD_ILS/0/SD_ILS:165270
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Author Huisman, Leendert M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power generation handbook fundamentals of low-emission, high-efficiency power plant operation
ent://SD_ILS/0/SD_ILS:293490
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Author Kiameh, Philip.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/power-generation-handbook-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering tools and methods
ent://SD_ILS/0/SD_ILS:539373
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Author Kamrani, Ali K. Azimi, Maryam.<br/>Preferred Shelf Number TA168 .S8855 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439809273">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Instrumentation design studies
ent://SD_ILS/0/SD_ILS:546041
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Author Doebelin, Ernest O., author.<br/>Preferred Shelf Number TA165 .D547 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439819494">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>