Search Results for Tests. - Narrowed by: Reliability (Engineering)
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTests.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300?
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Design and analysis of accelerated tests for mission critical reliability
ent://SD_ILS/0/SD_ILS:546254
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Author LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability analysis of modern power systems
ent://SD_ILS/0/SD_ILS:599018
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Author Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number TA169 .S234 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Product maturity. 1, Theoretical principals and industrial applications
ent://SD_ILS/0/SD_ILS:597455
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Author Bayle, Franck, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Product maturity. 2, Principles and illustrations
ent://SD_ILS/0/SD_ILS:597611
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Author Bayle, Franck, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Physics-Of-Healthy in Mechatronics.
ent://SD_ILS/0/SD_ILS:598146
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Author El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Preferred Shelf Number TA169 .E515 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:596162
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Author Elsayed, Elsayed A., author.<br/>Preferred Shelf Number TA169 .E52 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photovoltaic module reliability
ent://SD_ILS/0/SD_ILS:595739
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Author Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>