Search Results for Thin films -- Surfaces. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dThin$002bfilms$002b--$002bSurfaces.$0026ps$003d300? 2024-11-04T19:55:32Z Solid Surfaces, Interfaces and Thin Films ent://SD_ILS/0/SD_ILS:192384 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;L&uuml;th, Hans. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-13592-7">http://dx.doi.org/10.1007/978-3-642-13592-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Characterization of Polymer Surfaces and Thin Films ent://SD_ILS/0/SD_ILS:184197 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Grundke, Karina. editor.&#160;Stamm, Manfred. editor.&#160;Adler, Hans-J&uuml;rgen. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b104970">http://dx.doi.org/10.1007/b104970</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Magnetic properties of antiferromagnetic oxide materials surfaces, interfaces, and thin films ent://SD_ILS/0/SD_ILS:305037 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Du&ograve;, Lamberto.&#160;Finazzi, Marco.&#160;Ciccacci, Franco.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527630370">http://dx.doi.org/10.1002/9783527630370</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physico-chemical phenomena in thin films and at solid surfaces ent://SD_ILS/0/SD_ILS:146879 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Trakhtenberg, L. I. (Leonid Izra&#301;levich)&#160;Lin, S. H. (Sheng Hsien), 1937-&#160;Ilegbusi, O. J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725233">http://www.sciencedirect.com/science/book/9780123725233</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physico-chemical phenomena in thin films and at solid surfaces ent://SD_ILS/0/SD_ILS:146930 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Trakhtenberg, L. I. (Leonid Izra&#301;levich)&#160;Lin, S. H. (Sheng Hsien), 1937-&#160;Ilegbusi, O. J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725233">http://www.sciencedirect.com/science/book/9780123725233</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Correlation spectroscopy of surfaces, thin films, and nanostructures ent://SD_ILS/0/SD_ILS:302072 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Berakdar, J., 1964-&#160;Kirschner, J. (J&uuml;rgen), 1945-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425</a> John Wiley <a href="http://dx.doi.org/10.1002/3527603425">http://dx.doi.org/10.1002/3527603425</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Encyclopedia of materials characterization surfaces, interfaces, thin films ent://SD_ILS/0/SD_ILS:276320 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Brundle, C. R.&#160;Evans, Charles A.&#160;Wilson, Shaun.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080523606">http://www.sciencedirect.com/science/book/9780080523606</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Adhesion aspects of thin films ent://SD_ILS/0/SD_ILS:285378 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;International Symposium on Adhesion Aspects of Thin Films.&#160;MST Conferences (Firm)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789047415213">Distributed by publisher. 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Jane. editor.&#160;Chung, Yip-Wah. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330550.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-92897-5">http://dx.doi.org/10.1007/978-0-387-92897-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Tribology for Scientists and Engineers From Basics to Advanced Concepts ent://SD_ILS/0/SD_ILS:331290 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Menezes, Pradeep L. editor.&#160;Nosonovsky, Michael. editor.&#160;Ingole, Sudeep P. editor.&#160;Kailas, Satish V. editor.&#160;Lovell, Michael R. editor.<br/>Preferred Shelf Number&#160;ONLINE(331290.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1945-7">http://dx.doi.org/10.1007/978-1-4614-1945-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Chemical Solution Deposition of Functional Oxide Thin Films ent://SD_ILS/0/SD_ILS:332655 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Characterisation of Areal Surface Texture ent://SD_ILS/0/SD_ILS:334209 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Leach, Richard. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334209.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-36458-7">http://dx.doi.org/10.1007/978-3-642-36458-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Laser Surface Processing and Model Studies ent://SD_ILS/0/SD_ILS:334251 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Yilbas, Bekir Sami. author.&#160;Shuja, Shahzada Zaman. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334251.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-36629-1">http://dx.doi.org/10.1007/978-3-642-36629-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface Engineering for Enhanced Performance against Wear 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Semiconductors Materials, properties and applications ent://SD_ILS/0/SD_ILS:335654 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Bushby, Richard J. editor.&#160;Kelly, Stephen M. editor.&#160;O'Neill, Mary. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335654.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-2873-0">http://dx.doi.org/10.1007/978-90-481-2873-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spintronics From Materials to Devices ent://SD_ILS/0/SD_ILS:335658 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Felser, Claudia. editor.&#160;Fecher, Gerhard H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335658.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3832-6">http://dx.doi.org/10.1007/978-90-481-3832-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thin 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Film Transistors Physics and Technology of TFTs ent://SD_ILS/0/SD_ILS:332657 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Brotherton, S.D. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332657.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00002-2">http://dx.doi.org/10.1007/978-3-319-00002-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Crystallization of Nanoscaled Colloids ent://SD_ILS/0/SD_ILS:332701 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Born, Philip G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332701.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00230-9">http://dx.doi.org/10.1007/978-3-319-00230-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultrathin Metal Transparent Electrodes for the Optoelectronics Industry ent://SD_ILS/0/SD_ILS:332727 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(Michael A.)&#160;Lichtenberg, Allan J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1002/0471724254">Full text available from Wiley InterScience</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227410">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227410</a> John Wiley <a href="http://dx.doi.org/10.1002/0471724254">http://dx.doi.org/10.1002/0471724254</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109880578">http://www3.interscience.wiley.com/cgi-bin/bookhome/109880578</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0618/2004058503-b.html">http://catdir.loc.gov/catdir/enhancements/fy0618/2004058503-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reflection High-Energy Electron Diffraction ent://SD_ILS/0/SD_ILS:237310 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Ichimiya, Ayahiko.&#160;Cohen, Philip I..<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511735097">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface and thin film analysis principles, instrumentation, applications ent://SD_ILS/0/SD_ILS:301942 2024-11-04T19:55:32Z 2024-11-04T19:55:32Z Author&#160;Bubert, H. 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