Search Results for Thin films. - Narrowed by: Spectroscopy.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dThin$002bfilms.$0026qf$003dSUBJECT$002509Subject$002509Spectroscopy.$002509Spectroscopy.$0026te$003dILS$0026ps$003d300?
2025-01-18T15:13:51Z
Nanoscale Materials for Warfare Agent Detection: Nanoscience for Security
ent://SD_ILS/0/SD_ILS:482894
2025-01-18T15:13:51Z
2025-01-18T15:13:51Z
Author Bittencourt, Carla. editor. Ewels, Chris. editor. Llobet, Eduard. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-024-1620-6">https://doi.org/10.1007/978-94-024-1620-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multiscale Characterization of Biological Systems Spectroscopy and Modeling
ent://SD_ILS/0/SD_ILS:529478
2025-01-18T15:13:51Z
2025-01-18T15:13:51Z
Author Tomar, Vikas. author. Qu, Tao. author. Dubey, Devendra K. author. Verma, Devendra. author. Zhang, Yang. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-3453-9">https://doi.org/10.1007/978-1-4939-3453-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface Microscopy with Low Energy Electrons
ent://SD_ILS/0/SD_ILS:530807
2025-01-18T15:13:51Z
2025-01-18T15:13:51Z
Author Bauer, Ernst. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-0935-3">https://doi.org/10.1007/978-1-4939-0935-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Issues in Contemporary Oil Paint
ent://SD_ILS/0/SD_ILS:530714
2025-01-18T15:13:51Z
2025-01-18T15:13:51Z
Author Burnstock, Aviva. editor. de Keijzer, Matthijs. editor. Krueger, Jay. editor. Learner, Tom. editor. de Tagle, Alberto. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10100-2">https://doi.org/10.1007/978-3-319-10100-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:333265
2025-01-18T15:13:51Z
2025-01-18T15:13:51Z
Author Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>