Search Results for Thompson, Scott E. - Narrowed by: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dThompson$00252C$002bScott$002bE.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300?2024-10-24T20:26:01ZStrain Effect in Semiconductors Theory and Device Applicationsent://SD_ILS/0/SD_ILS:1719952024-10-24T20:26:01Z2024-10-24T20:26:01ZAuthor Sun, Yongke. author. Thompson, Scott E. author. Nishida, Toshikazu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-0552-9">http://dx.doi.org/10.1007/978-1-4419-0552-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-10-24T20:26:01Z2024-10-24T20:26:01ZAuthor Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>