Search Results for VLSI. - Narrowed by: 1985
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dVLSI.$0026qf$003dPUBDATE$002509Publication$002bDate$0025091985$0025091985$0026pe$003dd$00253A$0026ps$003d300?dt=list
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VLSI handbook
ent://SD_ILS/0/SD_ILS:255114
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Author Einspruch, Norman G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122341007">http://www.sciencedirect.com/science/book/9780122341007</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI electronics microstructure science
ent://SD_ILS/0/SD_ILS:254938
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Author Einspruch, Norman G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122341236">http://www.sciencedirect.com/science/book/9780122341236</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI and modern signal processing
ent://SD_ILS/0/SD_ILS:48143
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Author Kung, S. Y., ed. Whitehouse, H. J., ed. Kailath, T., ed.<br/>Preferred Shelf Number TK 5102.5 V18 1985<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Principles of CMOS VLSI design : a systems perspective
ent://SD_ILS/0/SD_ILS:59112
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Author Weste, Neil H. E. Eshraghian, K., ort. yaz.<br/>Preferred Shelf Number TK 7874 W46 1985<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Logic testing and design for testability
ent://SD_ILS/0/SD_ILS:220153
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Author Fujiwara, Hideo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>