Search Results for VLSI. - Narrowed by: Integrated circuits--Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dVLSI.$0026qf$003dSUBJECT$002509Subject$002509Integrated$002bcircuits--Testing.$002509Integrated$002bcircuits--Testing.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list
2024-06-30T06:44:45Z
Algorithmic and Knowledge-based CAD for VLSI
ent://SD_ILS/0/SD_ILS:247743
2024-06-30T06:44:45Z
2024-06-30T06:44:45Z
Author Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Testing Digital and mixed analogue/digital techniques
ent://SD_ILS/0/SD_ILS:247747
2024-06-30T06:44:45Z
2024-06-30T06:44:45Z
Author Hurst, Stanley L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS009E">http://dx.doi.org/10.1049/PBCS009E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>