Search Results for William, M., ed. - Narrowed by: McCall, James L., ed.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dWilliam$00252C$002bM.$00252C$002bed.$0026qf$003dAUTHOR$002509Author$002509McCall$00252C$002bJames$002bL.$00252C$002bed.$002509McCall$00252C$002bJames$002bL.$00252C$002bed.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-09-07T15:36:11ZMetallographic specimen preparation : optical and electron microscopyent://SD_ILS/0/SD_ILS:177342024-09-07T15:36:11Z2024-09-07T15:36:11ZAuthor McCall, James L., ed. Mueller William M., ed.<br/>Preferred Shelf Number TN 690.7 M47 1974<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Microstructural analysis tools and techniquesent://SD_ILS/0/SD_ILS:612662024-09-07T15:36:11Z2024-09-07T15:36:11ZAuthor McCall, James L., ed. Mueller, William, M., ed.<br/>Preferred Shelf Number TN 689.2 M53 1973<br/>Format: Books<br/>Availability Beytepe Library~1<br/>