Search Results for X-ray diffraction imaging.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dX-ray$002bdiffraction$002bimaging.$0026ps$003d300?dt=list2026-01-14T10:02:08ZProperties of crystalline materials by X-ray diffraction methods and symmetry groups : a practical approachent://SD_ILS/0/SD_ILS:5656882026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Mesa, John Fernando Zapata, 1971- author.<br/>Preferred Shelf Number QD921<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003344438">https://www.taylorfrancis.com/books/9781003344438</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientistsent://SD_ILS/0/SD_ILS:5603532026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Dong, ZhiLi, author.<br/>Preferred Shelf Number QD131 .D66 2022<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429351662">https://www.taylorfrancis.com/books/9780429351662</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>In-situ Studies with Photons, Neutrons and Electrons Scattering IIent://SD_ILS/0/SD_ILS:5308012026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Kannengiesser, Thomas. editor. Babu, Sudarsanam Suresh. editor. Komizo, Yu-ichi. editor. Ramirez, Antonio J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06145-0">https://doi.org/10.1007/978-3-319-06145-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistics of medical imagingent://SD_ILS/0/SD_ILS:5426952026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Lei, Tianhu., author.<br/>Preferred Shelf Number RC78.7 .D53 L45 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420088434">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Hot deformation and processing of aluminum alloysent://SD_ILS/0/SD_ILS:5469752026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor McQueen, H. J.<br/>Preferred Shelf Number TS209.5 .H675 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420017687">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Biochemical applications of nonlinear optical spectroscopyent://SD_ILS/0/SD_ILS:5414862026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Yakovlev, Vladislav.<br/>Preferred Shelf Number QP519.9 .L37 B56 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420068603">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:5435112026-01-14T10:02:08Z2026-01-14T10:02:08ZAuthor Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number TK7874.58 .B69 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>