Search Results for X-rays -- Diffraction. - Narrowed by: E-BookSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dX-rays$002b--$002bDiffraction.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026ps$003d300?2024-09-15T20:45:37ZStructure from diffraction methodsent://SD_ILS/0/SD_ILS:3442512024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Bruce, Duncan W., editor. O'Hare, Dermot, editor. Walton, Richard I., editor.<br/>Preferred Shelf Number QD461 .S9255 2014<br/>Electronic Access <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118695708">http://onlinelibrary.wiley.com/book/10.1002/9781118695708</a><br/>Format: Books<br/>Availability Online Library~1<br/>X-ray diffraction : modern experimental techniquesent://SD_ILS/0/SD_ILS:3428572024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Seeck, Oliver H., editor. Murphy, Bridget M., editor.<br/>Preferred Shelf Number ONLINE(342857.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814303606">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modern diffraction methodsent://SD_ILS/0/SD_ILS:3062182024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Mittemeijer, E. J. Welzel, Udo. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=446983">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527649884">http://dx.doi.org/10.1002/9783527649884</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-rays and materialsent://SD_ILS/0/SD_ILS:3054062024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Goudeau, Philippe. Guinebretière, René.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=425390">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118562888">http://dx.doi.org/10.1002/9781118562888</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Crystals, x-rays and proteins comprehensive protein crystallographyent://SD_ILS/0/SD_ILS:2311222024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Sherwood, Dennis. Cooper, Jon (Jonathan B.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Two-dimensional x-ray diffractionent://SD_ILS/0/SD_ILS:2977722024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor He, Bob B., 1954-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=33634">http://www.books24x7.com/marc.asp?bookid=33634</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470502648">http://dx.doi.org/10.1002/9780470502648</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10346379">http://site.ebrary.com/lib/alltitles/Doc?id=10346379</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles and applications of powder diffractionent://SD_ILS/0/SD_ILS:3033252024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Clearfield, Abraham. Reibenspies, Joseph Henry. Bhuvanesh, Nattamai. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781444305487">http://dx.doi.org/10.1002/9781444305487</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray diffraction by polycrystalline materialsent://SD_ILS/0/SD_ILS:3023532024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Guinebretiere, Rene. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html">http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612408">http://dx.doi.org/10.1002/9780470612408</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Collection of simulated XRD powder patterns for zeolitesent://SD_ILS/0/SD_ILS:2519162024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444507020">http://www.sciencedirect.com/science/book/9780444507020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to X-ray powder diffractometryent://SD_ILS/0/SD_ILS:3003742024-09-15T20:45:37Z2024-09-15T20:45:37ZAuthor Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/34476835.html">http://catalog.hathitrust.org/api/volumes/oclc/34476835.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118520994">http://dx.doi.org/10.1002/9781118520994</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>