Search Results for X-rays -- Diffraction. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dX-rays$002b--$002bDiffraction.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300?2024-11-09T10:12:32ZX-ray diffraction : modern experimental techniquesent://SD_ILS/0/SD_ILS:3428572024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Seeck, Oliver H., editor. Murphy, Bridget M., editor.<br/>Preferred Shelf Number ONLINE(342857.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814303606">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structure from diffraction methodsent://SD_ILS/0/SD_ILS:3442512024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Bruce, Duncan W., editor. O'Hare, Dermot, editor. Walton, Richard I., editor.<br/>Preferred Shelf Number QD461 .S9255 2014<br/>Electronic Access <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118695708">http://onlinelibrary.wiley.com/book/10.1002/9781118695708</a><br/>Format: Books<br/>Availability Online Library~1<br/>Modern diffraction methodsent://SD_ILS/0/SD_ILS:3062182024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Mittemeijer, E. J. Welzel, Udo. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=446983">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527649884">http://dx.doi.org/10.1002/9783527649884</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-rays and materialsent://SD_ILS/0/SD_ILS:3054062024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Goudeau, Philippe. Guinebretière, René.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=425390">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118562888">http://dx.doi.org/10.1002/9781118562888</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Crystals, x-rays and proteins comprehensive protein crystallographyent://SD_ILS/0/SD_ILS:2311222024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Sherwood, Dennis. Cooper, Jon (Jonathan B.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Two-dimensional x-ray diffractionent://SD_ILS/0/SD_ILS:2977722024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor He, Bob B., 1954-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=33634">http://www.books24x7.com/marc.asp?bookid=33634</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470502648">http://dx.doi.org/10.1002/9780470502648</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10346379">http://site.ebrary.com/lib/alltitles/Doc?id=10346379</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles and applications of powder diffractionent://SD_ILS/0/SD_ILS:3033252024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Clearfield, Abraham. Reibenspies, Joseph Henry. Bhuvanesh, Nattamai. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781444305487">http://dx.doi.org/10.1002/9781444305487</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray diffraction by polycrystalline materialsent://SD_ILS/0/SD_ILS:3023532024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Guinebretiere, Rene. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html">http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612408">http://dx.doi.org/10.1002/9780470612408</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Collection of simulated XRD powder patterns for zeolitesent://SD_ILS/0/SD_ILS:2519162024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444507020">http://www.sciencedirect.com/science/book/9780444507020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to X-ray powder diffractometryent://SD_ILS/0/SD_ILS:3003742024-11-09T10:12:32Z2024-11-09T10:12:32ZAuthor Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/34476835.html">http://catalog.hathitrust.org/api/volumes/oclc/34476835.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118520994">http://dx.doi.org/10.1002/9781118520994</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>