Search Results for diffraction. - Narrowed by: X-rays -- Diffraction.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003ddiffraction.$0026qf$003dSUBJECT$002509Subject$002509X-rays$002b--$002bDiffraction.$002509X-rays$002b--$002bDiffraction.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-09-22T21:33:56ZModern diffraction methodsent://SD_ILS/0/SD_ILS:3062182024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Mittemeijer, E. J. Welzel, Udo. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=446983">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527649884">http://dx.doi.org/10.1002/9783527649884</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structure from diffraction methodsent://SD_ILS/0/SD_ILS:3442512024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Bruce, Duncan W., editor. O'Hare, Dermot, editor. Walton, Richard I., editor.<br/>Preferred Shelf Number QD461 .S9255 2014<br/>Electronic Access <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118695708">http://onlinelibrary.wiley.com/book/10.1002/9781118695708</a><br/>Format: Books<br/>Availability Online Library~1<br/>X-ray diffraction by polycrystalline materialsent://SD_ILS/0/SD_ILS:3023532024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Guinebretiere, Rene. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html">http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612408">http://dx.doi.org/10.1002/9780470612408</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray diffraction : modern experimental techniquesent://SD_ILS/0/SD_ILS:3652642024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Seeck, Oliver H., 1966- editor. Murphy, Bridget M., 1969- editor.<br/>Preferred Shelf Number TA417.25 X73 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>X-ray diffraction : modern experimental techniquesent://SD_ILS/0/SD_ILS:3428572024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Seeck, Oliver H., editor. Murphy, Bridget M., editor.<br/>Preferred Shelf Number ONLINE(342857.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814303606">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Two-dimensional x-ray diffractionent://SD_ILS/0/SD_ILS:2977722024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor He, Bob B., 1954-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=33634">http://www.books24x7.com/marc.asp?bookid=33634</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470502648">http://dx.doi.org/10.1002/9780470502648</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10346379">http://site.ebrary.com/lib/alltitles/Doc?id=10346379</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Industrial applications of X-ray diffractionent://SD_ILS/0/SD_ILS:2688282024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Chung, Frank H., 1930- Smith, Deane K. (Deane Kingsley)<br/>Preferred Shelf Number TA417.25 I52 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>X-rays and materialsent://SD_ILS/0/SD_ILS:3054062024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Goudeau, Philippe. Guinebretière, René.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=425390">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118562888">http://dx.doi.org/10.1002/9781118562888</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Crystals, x-rays and proteins comprehensive protein crystallographyent://SD_ILS/0/SD_ILS:2311222024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Sherwood, Dennis. Cooper, Jon (Jonathan B.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Collection of simulated XRD powder patterns for zeolitesent://SD_ILS/0/SD_ILS:2519162024-09-22T21:33:56Z2024-09-22T21:33:56ZAuthor Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444507020">http://www.sciencedirect.com/science/book/9780444507020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>