Search Results for prediction. - Narrowed by: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dprediction.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2026-03-05T04:28:39ZStructural reliability analysis and predictionent://SD_ILS/0/SD_ILS:5938072026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.<br/>Preferred Shelf Number TA656.5 .M45 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:3559212026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Bernstein, Joseph.<br/>Preferred Shelf Number ONLINE(355921.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction with warranty data : issues, strategies, and methodsent://SD_ILS/0/SD_ILS:5431972026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Rai, Bharatendra K., author. Singh, Nanua.<br/>Preferred Shelf Number K1032 .C6 R35 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Reliability analysis of modern power systemsent://SD_ILS/0/SD_ILS:5990182026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number TA169 .S234 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Physics-Of-Healthy in Mechatronics.ent://SD_ILS/0/SD_ILS:5981462026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Preferred Shelf Number TA169 .E515 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Photovoltaic module reliabilityent://SD_ILS/0/SD_ILS:5957392026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:5937282026-03-05T04:28:39Z2026-03-05T04:28:39ZAuthor Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>