Search Results for test VLSI.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026ic$003dtrue$0026ps$003d300?dt=list
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VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
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Author Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:483582
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Author Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:486687
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Author Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
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Author Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:335156
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Author Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Preferred Shelf Number ONLINE(335156.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197090
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Author Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI test principles and architectures design for testability
ent://SD_ILS/0/SD_ILS:253779
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Author Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Biomedical Signal and Image Processing with Artificial Intelligence
ent://SD_ILS/0/SD_ILS:527214
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Author Paunwala, Chirag. editor. Paunwala, Mita. editor. Kher, Rahul. editor. Thakkar, Falgun. editor. Kher, Heena. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-15816-2">https://doi.org/10.1007/978-3-031-15816-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
ent://SD_ILS/0/SD_ILS:529793
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Author Mandal, Durbadal. editor. Kar, Rajib. editor. Das, Swagatam. editor. Panigrahi, Bijaya Ketan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-2268-2">https://doi.org/10.1007/978-81-322-2268-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
ent://SD_ILS/0/SD_ILS:529630
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Author Bhuvaneswari, M.C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-1958-3">https://doi.org/10.1007/978-81-322-1958-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
ent://SD_ILS/0/SD_ILS:220276
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Author Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Logic testing and design for testability
ent://SD_ILS/0/SD_ILS:220153
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Author Fujiwara, Hideo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>