Search Results for test VLSI. - Narrowed by: 2019
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092019$0025092019$0026ps$003d300?
2024-11-07T12:45:48Z
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2024-11-07T12:45:48Z
2024-11-07T12:45:48Z
Author Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:483582
2024-11-07T12:45:48Z
2024-11-07T12:45:48Z
Author Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
2024-11-07T12:45:48Z
2024-11-07T12:45:48Z
Author Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:486687
2024-11-07T12:45:48Z
2024-11-07T12:45:48Z
Author Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>