Search Results for test VLSI. - Narrowed by: Computers.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Konu$002509Computers.$002509Computers.$0026ps$003d300?dt=list
2026-03-20T18:41:38Z
VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:613347
2026-03-20T18:41:38Z
2026-03-20T18:41:38Z
Author Kaushik, Brajesh Kumar. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. (orcid)0000-0002-9113-5167 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-7470-7">https://doi.org/10.1007/978-981-10-7470-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618293
2026-03-20T18:41:38Z
2026-03-20T18:41:38Z
Author Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-46097-0">https://doi.org/10.1007/978-3-319-46097-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>