Search Results for test VLSI. - Narrowed by: Artificial intelligence.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Subject$002509Artificial$002bintelligence.$002509Artificial$002bintelligence.$0026ps$003d300?dt=list
2026-03-24T11:11:35Z
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:486687
2026-03-24T11:11:35Z
2026-03-24T11:11:35Z
Author Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
ent://SD_ILS/0/SD_ILS:529793
2026-03-24T11:11:35Z
2026-03-24T11:11:35Z
Author Mandal, Durbadal. editor. Kar, Rajib. editor. Das, Swagatam. editor. Panigrahi, Bijaya Ketan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-2268-2">https://doi.org/10.1007/978-81-322-2268-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>