Search Results for test VLSI. - Narrowed by: Processor Architectures.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Subject$002509Processor$002bArchitectures.$002509Processor$002bArchitectures.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-03-21T05:20:37Z
VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:613347
2026-03-21T05:20:37Z
2026-03-21T05:20:37Z
Author Kaushik, Brajesh Kumar. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. (orcid)0000-0002-9113-5167 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-7470-7">https://doi.org/10.1007/978-981-10-7470-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:335156
2026-03-21T05:20:37Z
2026-03-21T05:20:37Z
Author Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Preferred Shelf Number ONLINE(335156.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>