Search Results for test VLSI. - Narrowed by: VLSI.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Subject$002509VLSI.$002509VLSI.$0026ic$003dtrue$0026ps$003d300?dt=list2026-03-22T16:30:44ZVLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792026-03-22T16:30:44Z2026-03-22T16:30:44ZAuthor Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced research in VLSI proceedings of the fifth MIT conference, March 1988ent://SD_ILS/0/SD_ILS:2202762026-03-22T16:30:44Z2026-03-22T16:30:44ZAuthor Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Logic testing and design for testabilityent://SD_ILS/0/SD_ILS:2201532026-03-22T16:30:44Z2026-03-22T16:30:44ZAuthor Fujiwara, Hideo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>