Arama Sonu&ccedil;lar&#305; Applied Probability. - Daralt&#305;lm&#305;&#351;: 1990 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bProbability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091990$0025091990$0026ps$003d300?dt=list 2025-12-07T21:11:34Z Advances in applied probability. ent://SD_ILS/0/SD_ILS:226250 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Applied Probability Trust.<br/>Yer Numaras&#305;&#160;ALFABET&#304;K V.37 2005<br/>Elektronik Eri&#351;im&#160;<a href="http://web.ebscohost.com/ehost/detail?sid=377cd9e2-46b4-4008-b54d-aeb8222329eb%40sessionmgr12&vid=1&hid=19&bdata=JnNpdGU9ZWhvc3QtbGl2ZQ%3d%3d#db=bth&jid=1JC">Elektronik eri?im</a><br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~19&#160;~0<br/> Analysis of survival data ent://SD_ILS/0/SD_ILS:35550 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Cox, David Roxbee.&#160;Oakes, D., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 276 C665 1984<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Risks theory ent://SD_ILS/0/SD_ILS:69311 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Beard, Robert Eric.&#160;Pentikainen, T. ort. yaz.&#160;Pesonen, E., ort. yaz.<br/>Yer Numaras&#305;&#160;HG 8781 B34 1984<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Analysis of binary data ent://SD_ILS/0/SD_ILS:69660 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Cox, David Roxbee, 1924-&#160;Snell, E. J., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 279 C68 1970<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Nelson, Wayne, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finding groups in data an introduction to cluster analysis ent://SD_ILS/0/SD_ILS:295260 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Kaufman, Leonard.&#160;Rousseeuw, Peter J.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470316801">http://dx.doi.org/10.1002/9780470316801</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lisp-Stat an object-oriented environment for statistical computing and dynamic graphics ent://SD_ILS/0/SD_ILS:295261 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Tierney, Luke.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316818">http://dx.doi.org/10.1002/9780470316818</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods in engineering and quality assurance ent://SD_ILS/0/SD_ILS:295262 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;John, Peter William Meredith.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/21329921.html">http://catalog.hathitrust.org/api/volumes/oclc/21329921.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316825">http://dx.doi.org/10.1002/9780470316825</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:300353 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Staudte, Robert G.&#160;Sheather, Simon J.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118165485">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818924">Click here to view book</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:76992 2025-12-07T21:11:34Z 2025-12-07T21:11:34Z Yazar&#160;Staudte, Robert G.&#160;Sheather, Simon J., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 276.8 S74 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/>