Arama Sonuçları Applied Probability. - Daraltılmış: 2000SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bProbability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092000$0025092000$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2025-12-08T12:44:43ZAdvances in applied probability.ent://SD_ILS/0/SD_ILS:2262502025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Applied Probability Trust.<br/>Yer Numarası ALFABETİK V.37 2005<br/>Elektronik Erişim <a href="http://web.ebscohost.com/ehost/detail?sid=377cd9e2-46b4-4008-b54d-aeb8222329eb%40sessionmgr12&vid=1&hid=19&bdata=JnNpdGU9ZWhvc3QtbGl2ZQ%3d%3d#db=bth&jid=1JC">Elektronik eri?im</a><br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~19 ~0<br/>The theory of the design of experimentsent://SD_ILS/0/SD_ILS:5389092025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Cox, D. R. (David Roxbee), author. Reid, N.<br/>Yer Numarası QA279 .C73 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420035834">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Outliers in statistical dataent://SD_ILS/0/SD_ILS:861512025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Barnett, Vic. Lewis, Toby, ort. yaz.<br/>Yer Numarası QA 276 B2849 1994<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Design and analysis of experimentsent://SD_ILS/0/SD_ILS:1100962025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Hinkelmann, Klaus, 1932- Kempthorne, Oscar.<br/>Yer Numarası QA279 .K45 1994-05 V.2<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~2<br/>Finite mixture modelsent://SD_ILS/0/SD_ILS:3188032025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar McLachlan, Geoffrey J., 1946- Peel, David, 1971-<br/>Yer Numarası ONLINE(318803.1)<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fourier analysis of time series an introductionent://SD_ILS/0/SD_ILS:3188052025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Bloomfield, Peter, 1946-<br/>Yer Numarası ONLINE(318805.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1002/0471722235">Full text available from Wiley InterScience</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42810853.html">http://catalog.hathitrust.org/api/volumes/oclc/42810853.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Finite mixture modelsent://SD_ILS/0/SD_ILS:3002322025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar McLachlan, Geoffrey J., 1946- Peel, David, 1971- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471721182">http://dx.doi.org/10.1002/0471721182</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fourier analysis of time series an introductionent://SD_ILS/0/SD_ILS:3002392025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Bloomfield, Peter, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471722235">http://dx.doi.org/10.1002/0471722235</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smoothing and regression approaches, computation, and applicationent://SD_ILS/0/SD_ILS:3003432025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Schimek, Michael G. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150658">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Ruin probabilitiesent://SD_ILS/0/SD_ILS:1112972025-12-08T12:44:43Z2025-12-08T12:44:43ZYazar Asmussen, Soren.<br/>Yer Numarası HG8781 .A83 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>