Arama Sonu&ccedil;lar&#305; Applied Probability. - Daralt&#305;lm&#305;&#351;: 2000 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bProbability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092000$0025092000$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list 2025-12-08T12:44:43Z Advances in applied probability. ent://SD_ILS/0/SD_ILS:226250 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Applied Probability Trust.<br/>Yer Numaras&#305;&#160;ALFABET&#304;K V.37 2005<br/>Elektronik Eri&#351;im&#160;<a href="http://web.ebscohost.com/ehost/detail?sid=377cd9e2-46b4-4008-b54d-aeb8222329eb%40sessionmgr12&vid=1&hid=19&bdata=JnNpdGU9ZWhvc3QtbGl2ZQ%3d%3d#db=bth&jid=1JC">Elektronik eri?im</a><br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~19&#160;~0<br/> The theory of the design of experiments ent://SD_ILS/0/SD_ILS:538909 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Cox, D. R. (David Roxbee), author.&#160;Reid, N.<br/>Yer Numaras&#305;&#160;QA279 .C73 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420035834">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Outliers in statistical data ent://SD_ILS/0/SD_ILS:86151 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Barnett, Vic.&#160;Lewis, Toby, ort. yaz.<br/>Yer Numaras&#305;&#160;QA 276 B2849 1994<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Design and analysis of experiments ent://SD_ILS/0/SD_ILS:110096 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Hinkelmann, Klaus, 1932-&#160;Kempthorne, Oscar.<br/>Yer Numaras&#305;&#160;QA279 .K45 1994-05 V.2<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~2<br/> Finite mixture models ent://SD_ILS/0/SD_ILS:318803 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;McLachlan, Geoffrey J., 1946-&#160;Peel, David, 1971-<br/>Yer Numaras&#305;&#160;ONLINE(318803.1)<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030</a> MyiLibrary <a href="http://www.myilibrary.com?id=26492">http://www.myilibrary.com?id=26492</a> John Wiley <a href="http://dx.doi.org/10.1002/0471721182">http://dx.doi.org/10.1002/0471721182</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105">http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fourier analysis of time series an introduction ent://SD_ILS/0/SD_ILS:318805 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Bloomfield, Peter, 1946-<br/>Yer Numaras&#305;&#160;ONLINE(318805.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1002/0471722235">Full text available from Wiley InterScience</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=469233">http://public.eblib.com/choice/publicfullrecord.aspx?p=469233</a> ebrary <a href="http://site.ebrary.com/id/10304292">http://site.ebrary.com/id/10304292</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99031</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42810853.html">http://catalog.hathitrust.org/api/volumes/oclc/42810853.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finite mixture models ent://SD_ILS/0/SD_ILS:300232 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;McLachlan, Geoffrey J., 1946-&#160;Peel, David, 1971-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471721182">http://dx.doi.org/10.1002/0471721182</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105">http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fourier analysis of time series an introduction ent://SD_ILS/0/SD_ILS:300239 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Bloomfield, Peter, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236</a> John Wiley <a href="http://dx.doi.org/10.1002/0471722235">http://dx.doi.org/10.1002/0471722235</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smoothing and regression approaches, computation, and application ent://SD_ILS/0/SD_ILS:300343 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Schimek, Michael G.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150658">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ruin probabilities ent://SD_ILS/0/SD_ILS:111297 2025-12-08T12:44:43Z 2025-12-08T12:44:43Z Yazar&#160;Asmussen, Soren.<br/>Yer Numaras&#305;&#160;HG8781 .A83 2000<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/>