Arama Sonu&ccedil;lar&#305; Applied Statistics. - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bStatistics.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300$0026isd$003dtrue?dt=list 2025-12-06T17:39:51Z Modern applied U-statistics ent://SD_ILS/0/SD_ILS:297063 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Kowalski, Jeanne.&#160;Tu, Xin M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=331560">Click here to view book</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470186466">http://dx.doi.org/10.1002/9780470186466</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=120376&ref=toc">http://www.myilibrary.com?id=120376&ref=toc</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied statistics for economists ent://SD_ILS/0/SD_ILS:259263 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Lewis, Margaret, 1956-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://www.tandfebooks.com/isbn/9780203808450">Click here to view</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Principles of Applied Statistics ent://SD_ILS/0/SD_ILS:238490 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cox, D. R..&#160;Donnelly, Christl A..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9781139005036">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Probability and Statistics ent://SD_ILS/0/SD_ILS:165525 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Lefebvre, Mario. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-28505-9">http://dx.doi.org/10.1007/0-387-28505-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Theoretical and Applied Statistics ent://SD_ILS/0/SD_ILS:334010 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Torelli, Nicola. editor.&#160;Pesarin, Fortunato. editor.&#160;Bar-Hen, Avner. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334010.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35588-2">http://dx.doi.org/10.1007/978-3-642-35588-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistics Applied to Clinical Studies ent://SD_ILS/0/SD_ILS:206481 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cleophas, Ton J. author.&#160;Zwinderman, Aeilko H. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2863-9">http://dx.doi.org/10.1007/978-94-007-2863-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistics Applied to Clinical Trials ent://SD_ILS/0/SD_ILS:170560 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cleophas, Ton J. editor.&#160;Zwinderman, Aeilko H. editor.&#160;Cleophas, Toine F. editor.&#160;Cleophas, Eugene P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9523-8">http://dx.doi.org/10.1007/978-1-4020-9523-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistics Applied to Clinical Trials ent://SD_ILS/0/SD_ILS:168655 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cleophas, Ton J. author.&#160;Zwinderman, Aeilko H. author.&#160;Cleophas, Toine F. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-0570-9">http://dx.doi.org/10.1007/1-4020-0570-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied multivariate statistics for the social sciences ent://SD_ILS/0/SD_ILS:265555 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Stevens, James (James Paul)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://www.tandfebooks.com/isbn/9780203843130">Click here to view</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied spatial statistics for public health data ent://SD_ILS/0/SD_ILS:301609 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Waller, Lance A., 1965-&#160;Gotway, Carol A., 1961-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471662682">http://dx.doi.org/10.1002/0471662682</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied spatial statistics for public health data ent://SD_ILS/0/SD_ILS:152999 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Waller, Lance A., 1965-&#160;Gotway, Carol A., 1961-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=117073">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=117073</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Bayesian Statistics With R and OpenBUGS Examples ent://SD_ILS/0/SD_ILS:331839 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cowles, Mary Kathryn. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331839.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-5696-4">http://dx.doi.org/10.1007/978-1-4614-5696-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Topics in Applied Statistics 2012 Symposium of the International Chinese Statistical Association ent://SD_ILS/0/SD_ILS:332358 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hu, Mingxiu. editor.&#160;Liu, Yi. editor.&#160;Lin, Jianchang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332358.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7846-1">http://dx.doi.org/10.1007/978-1-4614-7846-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Statistics for Business and Management using Microsoft Excel 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Yazar&#160;Dehmer, Matthias, 1968-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527638079">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697816">Click here to view book</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527638079">http://onlinelibrary.wiley.com/book/10.1002/9783527638079</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Developments in Applied Probability and Statistics Dedicated to the Memory of J&uuml;rgen Lehn ent://SD_ILS/0/SD_ILS:198483 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Devroye, Luc. editor.&#160;Karas&ouml;zen, B&uuml;lent. editor.&#160;Kohler, Michael. editor.&#160;Korn, Ralf. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-7908-2598-5">http://dx.doi.org/10.1007/978-3-7908-2598-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical data analysis explained applied environmental statistics with R ent://SD_ILS/0/SD_ILS:303752 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Reimann, Clemens, 1952-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley 08 <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/118636013">An electronic book accessible through the World Wide Web; click for information</a> Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470987605">http://onlinelibrary.wiley.com/book/10.1002/9780470987605</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470987605">http://dx.doi.org/10.1002/9780470987605</a> MyiLibrary, Table of contents <a 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Estimation for Social Scientists ent://SD_ILS/0/SD_ILS:152062 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Lynch, Scott M.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-71265-9">http://dx.doi.org/10.1007/978-0-387-71265-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Asymptotics Case Studies in Small-Sample Statistics ent://SD_ILS/0/SD_ILS:238857 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Brazzale, A. R..&#160;Davison, A. C..&#160;Reid, N..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511611131">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Statistics Using SPSS, STATISTICA, MATLAB and R ent://SD_ILS/0/SD_ILS:186417 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Marques de S&aacute;, Joaquim P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71972-4">http://dx.doi.org/10.1007/978-3-540-71972-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of applied multivariate statistics and mathematical modeling ent://SD_ILS/0/SD_ILS:256589 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Tinsley, Howard E. A.&#160;Brown, Steven D. (Steven Douglas), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126913606">http://www.sciencedirect.com/science/book/9780126913606</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Developments in Modeling and Applications in Statistics ent://SD_ILS/0/SD_ILS:333571 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Oliveira, Paulo Eduardo. editor.&#160;da Gra&ccedil;a Temido, Maria. editor.&#160;Henriques, Carla. editor.&#160;Vichi, Maurizio. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333571.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32419-2">http://dx.doi.org/10.1007/978-3-642-32419-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Regression, Survival Analysis, Extreme Values, Markov Processes and Other Statistical Applications ent://SD_ILS/0/SD_ILS:333900 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Lita da Silva, Jo&atilde;o. editor.&#160;Caeiro, Frederico. editor.&#160;Nat&aacute;rio, Isabel. editor.&#160;Braumann, Carlos A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333900.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34904-1">http://dx.doi.org/10.1007/978-3-642-34904-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Statistical Methods for the Analysis of Large Data-Sets ent://SD_ILS/0/SD_ILS:194570 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Di Ciaccio, Agostino. editor.&#160;Coli, Mauro. editor.&#160;Angulo Ibanez, Jose Miguel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-21037-2">http://dx.doi.org/10.1007/978-3-642-21037-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ROC curves for continuous data ent://SD_ILS/0/SD_ILS:144430 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Krzanowski, W. J.&#160;Hand, D. J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=289478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=289478</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and analysis of experiments ent://SD_ILS/0/SD_ILS:301659 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hinkelmann, Klaus, 1932-&#160;Kempthorne, Oscar.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471709948">http://dx.doi.org/10.1002/0471709948</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/93002342.html">http://catdir.loc.gov/catdir/bios/wiley044/93002342.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finite mixture models ent://SD_ILS/0/SD_ILS:318803 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;McLachlan, Geoffrey J., 1946-&#160;Peel, David, 1971-<br/>Yer Numaras&#305;&#160;ONLINE(318803.1)<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99030</a> MyiLibrary <a href="http://www.myilibrary.com?id=26492">http://www.myilibrary.com?id=26492</a> John Wiley <a href="http://dx.doi.org/10.1002/0471721182">http://dx.doi.org/10.1002/0471721182</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105">http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fourier analysis of time series an introduction ent://SD_ILS/0/SD_ILS:318805 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Bloomfield, Peter, 1946-<br/>Yer Numaras&#305;&#160;ONLINE(318805.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1002/0471722235">Full text available from Wiley InterScience</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=469233">http://public.eblib.com/choice/publicfullrecord.aspx?p=469233</a> ebrary <a href="http://site.ebrary.com/id/10304292">http://site.ebrary.com/id/10304292</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=99031</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42810853.html">http://catalog.hathitrust.org/api/volumes/oclc/42810853.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smoothing and regression approaches, computation, and application ent://SD_ILS/0/SD_ILS:300343 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Schimek, Michael G.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150658">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finite mixture models ent://SD_ILS/0/SD_ILS:300232 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;McLachlan, Geoffrey J., 1946-&#160;Peel, David, 1971-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471721182">http://dx.doi.org/10.1002/0471721182</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105">http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/00043324.html">http://catdir.loc.gov/catdir/bios/wiley043/00043324.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fourier analysis of time series an introduction ent://SD_ILS/0/SD_ILS:300239 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Bloomfield, Peter, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780471722236</a> John Wiley <a href="http://dx.doi.org/10.1002/0471722235">http://dx.doi.org/10.1002/0471722235</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical modeling by wavelets ent://SD_ILS/0/SD_ILS:295281 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Vidakovic, Brani, 1955-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470317020">http://dx.doi.org/10.1002/9780470317020</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/98048449.html">http://catdir.loc.gov/catdir/bios/wiley047/98048449.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic dynamic programming and the control of queueing systems ent://SD_ILS/0/SD_ILS:295282 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Sennott, Linn I., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469893">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469893</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/38353366.html">http://catalog.hathitrust.org/api/volumes/oclc/38353366.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470317037">http://dx.doi.org/10.1002/9780470317037</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley046/98002777.html">http://catdir.loc.gov/catdir/bios/wiley046/98002777.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Simulation a modeler's approach ent://SD_ILS/0/SD_ILS:295285 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Thompson, James R. (James Robert), 1938-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470317068">http://dx.doi.org/10.1002/9780470317068</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/99033022.html">http://catdir.loc.gov/catdir/bios/wiley044/99033022.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical texts for mixed linear models ent://SD_ILS/0/SD_ILS:300350 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Khuri, Andr&eacute; I., 1940-&#160;Mathew, Thomas, 1955-&#160;Sinha, Bimal K., 1946-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118164860">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survey measurement and process quality ent://SD_ILS/0/SD_ILS:300371 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Lyberg, Lars.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ebrary <a href="http://site.ebrary.com/id/10595389">http://site.ebrary.com/id/10595389</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118490013">http://dx.doi.org/10.1002/9781118490013</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/35627703.html">http://catalog.hathitrust.org/api/volumes/oclc/35627703.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A probabilistic analysis of the Sacco and Vanzetti evidence ent://SD_ILS/0/SD_ILS:300340 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Kadane, Joseph B.&#160;Schum, David A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150580">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=819091">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=819091</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95042458.html">http://catdir.loc.gov/catdir/bios/wiley041/95042458.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian methods and ethics in a clinical trial design ent://SD_ILS/0/SD_ILS:300341 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Kadane, Joseph B.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150603">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818801">Click here to view book</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/95014352.html">http://catdir.loc.gov/catdir/bios/wiley042/95014352.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Business survey methods ent://SD_ILS/0/SD_ILS:300338 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Cox, Brenda G.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150504">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818800">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818800</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Markov decision processes discrete stochastic dynamic programming ent://SD_ILS/0/SD_ILS:295268 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Puterman, Martin L.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470316887">http://dx.doi.org/10.1002/9780470316887</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Alternative methods of regression ent://SD_ILS/0/SD_ILS:300332 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Birkes, David.&#160;Dodge, Yadolah, 1944-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150238">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818791">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818791</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/92031165.html">http://catdir.loc.gov/catdir/bios/wiley041/92031165.html</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10504196">http://site.ebrary.com/lib/alltitles/Doc?id=10504196</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Variance components ent://SD_ILS/0/SD_ILS:295265 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Searle, S. R. (Shayle R.), 1928-&#160;Casella, George.&#160;McCulloch, Charles E.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468694">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468694</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316856">http://dx.doi.org/10.1002/9780470316856</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470316856">http://onlinelibrary.wiley.com/book/10.1002/9780470316856</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/23902113.html">http://catalog.hathitrust.org/api/volumes/oclc/23902113.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Discriminant analysis and statistical pattern recognition ent://SD_ILS/0/SD_ILS:300250 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;McLachlan, Geoffrey J., 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725293">http://dx.doi.org/10.1002/0471725293</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/24247203.html">http://catalog.hathitrust.org/api/volumes/oclc/24247203.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical intervals a guide for practitioners ent://SD_ILS/0/SD_ILS:295257 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hahn, Gerald J.&#160;Meeker, William Q.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470316771">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=695349">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=695349</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10504140">http://site.ebrary.com/lib/alltitles/Doc?id=10504140</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/23139974.html">http://catalog.hathitrust.org/api/volumes/oclc/23139974.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of exploratory analysis of variance ent://SD_ILS/0/SD_ILS:295263 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hoaglin, David C. (David Caster), 1944-&#160;Mosteller, Frederick, 1916-2006.&#160;Tukey, John W. (John Wilder), 1915-2000.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468776">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468776</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316832">http://dx.doi.org/10.1002/9780470316832</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Forecasting with dynamic regression models ent://SD_ILS/0/SD_ILS:300339 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Pankratz, Alan, 1944-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150528">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A user's guide to principal components ent://SD_ILS/0/SD_ILS:300252 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Jackson, J. Edward.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725331">http://dx.doi.org/10.1002/0471725331</a> ebrary <a href="http://site.ebrary.com/id/10275067">http://site.ebrary.com/id/10275067</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Nelson, Wayne, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finding groups in data an introduction to cluster analysis ent://SD_ILS/0/SD_ILS:295260 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Kaufman, Leonard.&#160;Rousseeuw, Peter J.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470316801">http://dx.doi.org/10.1002/9780470316801</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods in engineering and quality assurance ent://SD_ILS/0/SD_ILS:295262 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;John, Peter William Meredith.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/21329921.html">http://catalog.hathitrust.org/api/volumes/oclc/21329921.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316825">http://dx.doi.org/10.1002/9780470316825</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lisp-Stat an object-oriented environment for statistical computing and dynamic graphics ent://SD_ILS/0/SD_ILS:295261 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Tierney, Luke.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316818">http://dx.doi.org/10.1002/9780470316818</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:300353 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Staudte, Robert G.&#160;Sheather, Simon J.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118165485">An electronic book accessible through the World Wide Web; 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Ronald, 1942-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316719">http://dx.doi.org/10.1002/9780470316719</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/14069052.html">http://catalog.hathitrust.org/api/volumes/oclc/14069052.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic simulation ent://SD_ILS/0/SD_ILS:295254 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Ripley, Brian D., 1952-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469837">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469837</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/13822487.html">http://catalog.hathitrust.org/api/volumes/oclc/13822487.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316726">http://dx.doi.org/10.1002/9780470316726</a> Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9780470009604">http://proquest.safaribooksonline.com/?fpi=9780470009604</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9780470009604">http://proquest.tech.safaribooksonline.de/9780470009604</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multiple comparison procedures ent://SD_ILS/0/SD_ILS:295251 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hochberg, Yosef.&#160;Tamhane, Ajit C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470316672">http://dx.doi.org/10.1002/9780470316672</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust regression and outlier detection ent://SD_ILS/0/SD_ILS:300253 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Rousseeuw, Peter J.&#160;Leroy, Annick M.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725382">http://dx.doi.org/10.1002/0471725382</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Loss distributions ent://SD_ILS/0/SD_ILS:292309 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hogg, Robert V.&#160;Klugman, Stuart A., 1949-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;HG8781 H63 1984EB<br/>Elektronik Eri&#351;im&#160;<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470316634">http://onlinelibrary.wiley.com/book/10.1002/9780470316634</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Loss distributions ent://SD_ILS/0/SD_ILS:295247 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hogg, Robert V.&#160;Klugman, Stuart A., 1949-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468960">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468960</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316634">http://dx.doi.org/10.1002/9780470316634</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/9970528.html">http://catalog.hathitrust.org/api/volumes/oclc/9970528.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Forecasting with univariate Box-Jenkins models concepts and cases ent://SD_ILS/0/SD_ILS:295245 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Pankratz, Alan, 1944-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469783">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469783</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316566">http://dx.doi.org/10.1002/9780470316566</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods for forecasting ent://SD_ILS/0/SD_ILS:295246 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Abraham, Bovas, 1942-&#160;Ledolter, Johannes.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468971">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468971</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316610">http://dx.doi.org/10.1002/9780470316610</a> <a href="http://catdir.loc.gov/catdir/bios/wiley043/83007006.html">http://catdir.loc.gov/catdir/bios/wiley043/83007006.html</a> <a href="http://catdir.loc.gov/catdir/description/wiley035/83007006.html">http://catdir.loc.gov/catdir/description/wiley035/83007006.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/9413132.html">http://catalog.hathitrust.org/api/volumes/oclc/9413132.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied life data analysis ent://SD_ILS/0/SD_ILS:300248 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Nelson, Wayne, 1936-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multiple time series ent://SD_ILS/0/SD_ILS:295237 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hannan, E. J. (Edward James), 1921-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469488">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469488</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316429">http://dx.doi.org/10.1002/9780470316429</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=469488">http://swb.eblib.com/patron/FullRecord.aspx?p=469488</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/99892.html">http://catalog.hathitrust.org/api/volumes/oclc/99892.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Some recent advances in mathematics and statistics proceedings of Statistics 2011 Canada/IMST 2011-FIM XX, Montreal, Canada, 1-4 July 2011 ent://SD_ILS/0/SD_ILS:281243 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Canadian Conference in Applied Statistics (5th : 2011 : Montr&eacute;al, Qu&eacute;bec)&#160;Chaubey, Yogendra P.&#160;World Scientific (Firm)&#160;Forum for Interdisciplinary Mathematics. 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(orcid)0000-0002-6005-1497&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-30510-8">https://doi.org/10.1007/978-3-031-30510-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Science and Its Applications - ICCSA 2023 Workshops Athens, Greece, July 3-6, 2023, Proceedings, Part II ent://SD_ILS/0/SD_ILS:521298 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Gervasi, Osvaldo. editor. (orcid)&#160;Murgante, Beniamino. editor. (orcid)&#160;Rocha, Ana Maria A. C. editor. (orcid)&#160;Garau, Chiara. editor. 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Proceedings ent://SD_ILS/0/SD_ILS:518787 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Hanbury, Allan. editor.&#160;Kazai, Gabriella. editor.&#160;Rauber, Andreas. editor.&#160;Fuhr, Norbert. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-16354-3">https://doi.org/10.1007/978-3-319-16354-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Science and Its Applications -- ICCSA 2015 15th International Conference, Banff, AB, Canada, June 22-25, 2015, Proceedings, Part II ent://SD_ILS/0/SD_ILS:518794 2025-12-06T17:39:51Z 2025-12-06T17:39:51Z Yazar&#160;Gervasi, Osvaldo. editor.&#160;Murgante, Beniamino. editor.&#160;Misra, Sanjay. editor.&#160;Gavrilova, Marina L. editor.&#160;Rocha, Ana Maria Alves Coutinho. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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