Arama Sonu&ccedil;lar&#305; Applied statistics - Daralt&#305;lm&#305;&#351;: Analysis of variance. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bstatistics$0026qf$003dSUBJECT$002509Konu$002509Analysis$002bof$002bvariance.$002509Analysis$002bof$002bvariance.$0026ps$003d300? 2024-12-03T07:17:02Z Applied statistics : analysis of variance and regression ent://SD_ILS/0/SD_ILS:93344 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Mickey, Ruth M.&#160;Dunn, Olive Jean.&#160;Clark, Virginia, 1928-<br/>Yer Numaras&#305;&#160;QA 279 M45 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Applied statistics : analysis of variance and regression. ent://SD_ILS/0/SD_ILS:93944 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Mickey, Ruth M., 1954-&#160;Dunn, Olive Jean, ort. yaz.&#160;Clark, Virginia, 1928- ort. yaz.<br/>Yer Numaras&#305;&#160;QA 279 M45 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Analysis of variance for functional data ent://SD_ILS/0/SD_ILS:285324 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Zhang, Jin-Ting, 1964-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439862742">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Components of variance ent://SD_ILS/0/SD_ILS:106204 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Cox, D. R.&#160;Solomon, P. J., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 279 .C69 2003<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Variance components ent://SD_ILS/0/SD_ILS:295265 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Searle, S. R. (Shayle R.), 1928-&#160;Casella, George.&#160;McCulloch, Charles E.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468694">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468694</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316856">http://dx.doi.org/10.1002/9780470316856</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470316856">http://onlinelibrary.wiley.com/book/10.1002/9780470316856</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/23902113.html">http://catalog.hathitrust.org/api/volumes/oclc/23902113.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of exploratory analysis of variance ent://SD_ILS/0/SD_ILS:295263 2024-12-03T07:17:02Z 2024-12-03T07:17:02Z Yazar&#160;Hoaglin, David C. (David Caster), 1944-&#160;Mosteller, Frederick, 1916-2006.&#160;Tukey, John W. (John Wilder), 1915-2000.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468776">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468776</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316832">http://dx.doi.org/10.1002/9780470316832</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>