Arama Sonu&ccedil;lar&#305; Applied statistics - Daralt&#305;lm&#305;&#351;: Regression analysis. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dApplied$002bstatistics$0026qf$003dSUBJECT$002509Konu$002509Regression$002banalysis.$002509Regression$002banalysis.$0026ic$003dtrue$0026ps$003d300? 2024-12-12T06:54:35Z Applied statistics : analysis of variance and regression ent://SD_ILS/0/SD_ILS:93344 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Mickey, Ruth M.&#160;Dunn, Olive Jean.&#160;Clark, Virginia, 1928-<br/>Yer Numaras&#305;&#160;QA 279 M45 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Applied statistics : analysis of variance and regression. ent://SD_ILS/0/SD_ILS:93944 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Mickey, Ruth M., 1954-&#160;Dunn, Olive Jean, ort. yaz.&#160;Clark, Virginia, 1928- ort. yaz.<br/>Yer Numaras&#305;&#160;QA 279 M45 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Simultaneous inference in regression ent://SD_ILS/0/SD_ILS:287042 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Liu, Wei, 1964 Apr. 15-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439828106">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measurement error in nonlinear models a modern perspective. ent://SD_ILS/0/SD_ILS:289457 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Carroll, Raymond J.&#160;Carroll, Raymond J. Measurement error in nonlinear models.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420010138">Distributed by publisher. 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Ronald, 1942-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316719">http://dx.doi.org/10.1002/9780470316719</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/14069052.html">http://catalog.hathitrust.org/api/volumes/oclc/14069052.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust regression and outlier detection ent://SD_ILS/0/SD_ILS:300253 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Rousseeuw, Peter J.&#160;Leroy, Annick M.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725382">http://dx.doi.org/10.1002/0471725382</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical methods for forecasting ent://SD_ILS/0/SD_ILS:295246 2024-12-12T06:54:35Z 2024-12-12T06:54:35Z Yazar&#160;Abraham, Bovas, 1942-&#160;Ledolter, Johannes.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468971">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468971</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316610">http://dx.doi.org/10.1002/9780470316610</a> <a href="http://catdir.loc.gov/catdir/bios/wiley043/83007006.html">http://catdir.loc.gov/catdir/bios/wiley043/83007006.html</a> <a href="http://catdir.loc.gov/catdir/description/wiley035/83007006.html">http://catdir.loc.gov/catdir/description/wiley035/83007006.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/9413132.html">http://catalog.hathitrust.org/api/volumes/oclc/9413132.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>