Arama Sonuçları Atomic force microscopy. - Daraltılmış: 2009SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dAtomic$002bforce$002bmicroscopy.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092009$0025092009$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-12-26T22:46:26ZNoncontact Atomic Force Microscopy Volume 2ent://SD_ILS/0/SD_ILS:1900172024-12-26T22:46:26Z2024-12-26T22:46:26ZYazar Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-01495-6">http://dx.doi.org/10.1007/978-3-642-01495-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atomic force microscopy in process engineering introduction to AFM for improved processes and productsent://SD_ILS/0/SD_ILS:1451962024-12-26T22:46:26Z2024-12-26T22:46:26ZYazar Bowen, W. Richard. Hilal, Nidal.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781856175173">http://www.sciencedirect.com/science/book/9781856175173</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>