Arama Sonuçları Atomic force microscopy. - Daraltılmış: Engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dAtomic$002bforce$002bmicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026pe$003dd$00253A$0026ps$003d300?dt=list
2024-12-26T22:35:56Z
Noncontact Atomic Force Microscopy Volume 2
ent://SD_ILS/0/SD_ILS:190017
2024-12-26T22:35:56Z
2024-12-26T22:35:56Z
Yazar Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-01495-6">http://dx.doi.org/10.1007/978-3-642-01495-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
ent://SD_ILS/0/SD_ILS:194334
2024-12-26T22:35:56Z
2024-12-26T22:35:56Z
Yazar Xie, Hui. author. Onal, Cagdas. author. Régnier, Stéphane. author. Sitti, Metin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-20329-9">http://dx.doi.org/10.1007/978-3-642-20329-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>