Arama Sonu&ccedil;lar&#305; Behavior Analysis. - Daralt&#305;lm&#305;&#351;: SCIENCE. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dBehavior$002bAnalysis.$0026qf$003dSUBJECT$002509Konu$002509SCIENCE.$002509SCIENCE.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list 2026-03-17T07:58:05Z Rheology, Physical and Mechanical Behavior of Materials. 1, Physical Mechanisms of Deformation and Dynamic Behavior ent://SD_ILS/0/SD_ILS:598784 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Leroy, Maurice.<br/>Yer Numaras&#305;&#160;TA407 .L47 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394255627">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394255627</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Conformational analysis of polymers : methods and techniques for structure-property relationships and molecular design ent://SD_ILS/0/SD_ILS:598132 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Sasanuma, Yuji, author.<br/>Yer Numaras&#305;&#160;QD381 .S287 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119716655">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119716655</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Low electromagnetic field exposure wireless devices : fundamentals and recent advances ent://SD_ILS/0/SD_ILS:598056 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Ur-Rehman, Masood, editor. http://id.loc.gov/authorities/names/nb2016013486&#160;Jamshed, Muhammad Ali, editor. http://id.loc.gov/authorities/names/no2022117254&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;QC661 .L89 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119909194">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119909194</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fluid-Structure Interaction : Numerical Simulation Techniques for Naval Applications ent://SD_ILS/0/SD_ILS:598147 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Sigrist, Jean-Fran&ccedil;ois, author.&#160;Leblond, C&eacute;dric, author.<br/>Yer Numaras&#305;&#160;TA357.5 .F58<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Voltage-enhanced processing of biomass and biochar ent://SD_ILS/0/SD_ILS:597667 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Diaz, Gerardo (Gerardo C.), author.<br/>Yer Numaras&#305;&#160;TP339 .D53 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119739777">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119739777</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nonthermal plasmas for materials processing ent://SD_ILS/0/SD_ILS:597686 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Friedrich, J&ouml;rg Florian, author.&#160;Meichsner, J&uuml;rgen, author.<br/>Yer Numaras&#305;&#160;TA2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364757">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364757</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modern trends in structural and solid mechanics 1 : statics and stability ent://SD_ILS/0/SD_ILS:596825 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Challamel, No&euml;l, editor.&#160;Kaplunov, J. D., editor.&#160;Takewaki, Izuru, editor.<br/>Yer Numaras&#305;&#160;TA645 .M63 2021 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831891">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831891</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Geological carbon storage : subsurface seals and caprock integrity ent://SD_ILS/0/SD_ILS:594917 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Vialle, St&eacute;phanie, editor.&#160;Ajo-Franklin, Jonathan, editor.&#160;Carey, J. William, editor.<br/>Yer Numaras&#305;&#160;QE516 .C37<br/>Elektronik Eri&#351;im&#160;<a href="https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119118657">https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119118657</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Immittance spectroscopy : applications to material systems ent://SD_ILS/0/SD_ILS:594096 2026-03-17T07:58:05Z 2026-03-17T07:58:05Z Yazar&#160;Alim, Mohammad A., author.<br/>Yer Numaras&#305;&#160;QD116 .I57 A55 2017<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119185413">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119185413</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>