Arama Sonu&ccedil;lar&#305; Biggio, Battista. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dBiggio$00252C$002bBattista.$0026ps$003d300?dt=list 2026-06-01T10:29:33Z Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17&ndash;19, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399034 2026-06-01T10:29:33Z 2026-06-01T10:29:33Z Yazar&#160;Bai, Xiao. editor.&#160;Hancock, Edwin R. editor.&#160;Ho, Tin Kam. editor.&#160;Wilson, Richard C. editor.&#160;Biggio, Battista. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-97785-0">https://doi.org/10.1007/978-3-319-97785-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, M&eacute;rida, Mexico, November 29 - December 2, 2016, Proceedings ent://SD_ILS/0/SD_ILS:615924 2026-06-01T10:29:33Z 2026-06-01T10:29:33Z Yazar&#160;Robles-Kelly, Antonio. editor.&#160;Loog, Marco. editor.&#160;Biggio, Battista. editor.&#160;Escolano, Francisco. editor.&#160;Wilson, Richard. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-49055-7">https://doi.org/10.1007/978-3-319-49055-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>