Arama Sonuçları Biometrics. - Daraltılmış: 2023
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dBiometrics.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092023$0025092023$0026ps$003d300$0026isd$003dtrue?dt=list
2024-11-22T14:09:26Z
Handbook of Biometric Anti-Spoofing Presentation Attack Detection and Vulnerability Assessment
ent://SD_ILS/0/SD_ILS:520282
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Marcel, Sébastien. editor. Fierrez, Julian. editor. Evans, Nicholas. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520282.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-5288-3">https://doi.org/10.1007/978-981-19-5288-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:520799
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(520799.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Vision - ACCV 2022 16th Asian Conference on Computer Vision, Macao, China, December 4-8, 2022, Proceedings, Part IV
ent://SD_ILS/0/SD_ILS:520834
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Wang, Lei. editor. Gall, Juergen. editor. Chin, Tat-Jun. editor. Sato, Imari. editor. Chellappa, Rama. editor.<br/>Yer Numarası XX(520834.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26316-3">https://doi.org/10.1007/978-3-031-26316-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Image Analysis 22nd Scandinavian Conference, SCIA 2023, Sirkka, Finland, April 18-21, 2023, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:520849
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Gade, Rikke. editor. Felsberg, Michael. editor. Kämäräinen, Joni-Kristian. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520849.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31438-4">https://doi.org/10.1007/978-3-031-31438-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Trends in Cybersecurity Applications
ent://SD_ILS/0/SD_ILS:520552
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Daimi, Kevin. editor. Alsadoon, Abeer. editor. Peoples, Cathryn. editor. El Madhoun, Nour. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520552.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-09640-2">https://doi.org/10.1007/978-3-031-09640-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ethical and Social Issues in the Information Age
ent://SD_ILS/0/SD_ILS:520570
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Kizza, Joseph Migga. author. SpringerLink (Online service)<br/>Yer Numarası XX(520570.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24863-4">https://doi.org/10.1007/978-3-031-24863-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Cybersecurity and Evolutionary Data Engineering Select Proceedings of the 2nd International Conference, ICCEDE 2022
ent://SD_ILS/0/SD_ILS:520628
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Jain, Raj. editor. Travieso, Carlos M. editor. Kumar, Sanjeev. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520628.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5080-5">https://doi.org/10.1007/978-981-99-5080-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New Trends in Information and Communications Technology Applications 6th International Conference, NTICT 2022, Baghdad, Iraq, November 16-17, 2022, Proceedings
ent://SD_ILS/0/SD_ILS:520772
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Al-Bakry, Abbas M. editor. (orcid) Al-Mamory, Safaa O. editor. Sahib, Mouayad A. editor. (orcid) George, Loay E. editor. Aldhaibani, Jaafar A. editor. (orcid)<br/>Yer Numarası XX(520772.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35442-7">https://doi.org/10.1007/978-3-031-35442-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Artificial Intelligence and Soft Computing 22nd International Conference, ICAISC 2023, Zakopane, Poland, June 18-22, 2023, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:521138
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. (orcid) Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(521138.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42508-0">https://doi.org/10.1007/978-3-031-42508-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Information Systems and Industrial Management 22nd International Conference, CISIM 2023, Tokyo, Japan, September 22-24, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521140
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Saeed, Khalid. editor. (orcid) Dvorský, Jiří. editor. Nishiuchi, Nobuyuki. editor. Fukumoto, Makoto. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521140.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42823-4">https://doi.org/10.1007/978-3-031-42823-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer Analysis of Images and Patterns 20th International Conference, CAIP 2023, Limassol, Cyprus, September 25-28, 2023, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:521159
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Tsapatsoulis, Nicolas. editor. Lanitis, Andreas. editor. Pattichis, Marios. editor. Pattichis, Constantinos. editor. Kyrkou, Christos. editor.<br/>Yer Numarası XX(521159.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44240-7">https://doi.org/10.1007/978-3-031-44240-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern Recognition and Machine Intelligence 10th International Conference, PReMI 2023, Kolkata, India, December 12-15, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521329
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Maji, Pradipta. editor. Huang, Tingwen. editor. Pal, Nikhil R. editor. Chaudhury, Santanu. editor. De, Rajat K. editor.<br/>Yer Numarası XX(521329.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45170-6">https://doi.org/10.1007/978-3-031-45170-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Visual Computing 18th International Symposium, ISVC 2023, Lake Tahoe, NV, USA, October 16-18, 2023, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:521353
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Bebis, George. editor. Ghiasi, Golnaz. editor. Fang, Yi. editor. Sharf, Andrei. editor. Dong, Yue. editor.<br/>Yer Numarası XX(521353.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-47969-4">https://doi.org/10.1007/978-3-031-47969-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Biometric Recognition 17th Chinese Conference, CCBR 2023, Xuzhou, China, December 1-3, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521358
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Jia, Wei. editor. Kang, Wenxiong. editor. Pan, Zaiyu. editor. Ben, Xianye. editor. Bian, Zhengfu. editor.<br/>Yer Numarası XX(521358.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-8565-4">https://doi.org/10.1007/978-981-99-8565-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Information Security Practice and Experience 18th International Conference, ISPEC 2023, Copenhagen, Denmark, August 24-25, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521323
2024-11-22T14:09:26Z
2024-11-22T14:09:26Z
Yazar Meng, Weizhi. editor. Yan, Zheng. editor. Piuri, Vincenzo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521323.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7032-2">https://doi.org/10.1007/978-981-99-7032-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>