Arama Sonuçları Cluster - Daraltılmış: Quality Control.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dCluster$0026qf$003dSUBJECT$002509Konu$002509Quality$002bControl.$002509Quality$002bControl.$0026ps$003d300?
2026-03-02T16:08:12Z
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
2026-03-02T16:08:12Z
2026-03-02T16:08:12Z
Yazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Statistical quality control using Minitab, R, JMP, and Python
ent://SD_ILS/0/SD_ILS:596129
2026-03-02T16:08:12Z
2026-03-02T16:08:12Z
Yazar Gupta, Bhisham C., 1942- author.<br/>Yer Numarası TS156 .Q3 G86 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>