Arama Sonu&ccedil;lar&#305; Computer Science. - Daralt&#305;lm&#305;&#351;: 1990 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bScience.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091990$0025091990$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-27T02:50:02Z Applications of spatial data structures : Computer graphics, image processing, and GIS ent://SD_ILS/0/SD_ILS:88781 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Samet, Hanan.<br/>Yer Numaras&#305;&#160;QA 76.9.D35 S25 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Automatic verification methods for finite stste systems : International workshop, Grenoble, France, June 1989: Proceedings. ent://SD_ILS/0/SD_ILS:37366 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yer Numaras&#305;&#160;TK 5105.5 A97 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Introduction to statistical pattern recognition ent://SD_ILS/0/SD_ILS:268708 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Fukunaga, Keinosuke.<br/>Yer Numaras&#305;&#160;Q327 F85 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Introduction to statistical pattern recognition ent://SD_ILS/0/SD_ILS:276343 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Fukunaga, Keinosuke.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080478654">http://www.sciencedirect.com/science/book/9780080478654</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ACM Communications. ent://SD_ILS/0/SD_ILS:226216 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Association for Computing Machinery.<br/>Yer Numaras&#305;&#160;ALFABET&#304;K V.35 PART.2 1992<br/>Elektronik Eri&#351;im&#160;<a href="http://dl.acm.org/citation.cfm?id=J79&picked=prox">Elektronik eri?im</a><br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~36&#160;~0<br/> ACM Transactions on database systems. ent://SD_ILS/0/SD_ILS:226217 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Association for Computing Machinery.<br/>Yer Numaras&#305;&#160;ALFABET&#304;K V.4 1979<br/>Elektronik Eri&#351;im&#160;<a href="http://dl.acm.org/citation.cfm?id=J777&picked=prox">Elektronik eri?im</a><br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~12&#160;~0<br/> Acta informatica. ent://SD_ILS/0/SD_ILS:226235 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yer Numaras&#305;&#160;ALFABET&#304;K V.12 1979<br/>Elektronik Eri&#351;im&#160;<a href="http://www.springerlink.com/content/100460/?MUD=MP">Elektronik eri?im</a><br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~10&#160;~0<br/> Connectionist symbol processing ent://SD_ILS/0/SD_ILS:220187 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Hinton, Geoffrey E.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267281">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267281</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Artificial experts social knowledge and intelligent machines ent://SD_ILS/0/SD_ILS:220115 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Collins, H. M. (Harry M.), 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267240">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267240</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lisp-Stat an object-oriented environment for statistical computing and dynamic graphics ent://SD_ILS/0/SD_ILS:295261 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Tierney, Luke.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316818">http://dx.doi.org/10.1002/9780470316818</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Digital systems testing and testable design ent://SD_ILS/0/SD_ILS:249585 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;Abramovici, Miron.&#160;Breuer, Melvin A.&#160;Friedman, Arthur D.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Knowledge-based Systems for Industrial Control ent://SD_ILS/0/SD_ILS:247700 2024-11-27T02:50:02Z 2024-11-27T02:50:02Z Yazar&#160;McGhee, J., ed.&#160;Grimble, M. J., ed.&#160;Mowforth, P., ed.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBCE044E">http://dx.doi.org/10.1049/PBCE044E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>