Arama Sonuçları Computer networks -- Testing. - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bnetworks$002b--$002bTesting.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?2025-12-31T11:24:26ZArtificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206822025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36336-8">https://doi.org/10.1007/978-3-031-36336-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5208462025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Wyrzykowski, Roman. editor. Dongarra, Jack. editor. Deelman, Ewa. editor. Karczewski, Konrad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30445-3">https://doi.org/10.1007/978-3-031-30445-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Penetration tester's open source toolkitent://SD_ILS/0/SD_ILS:4591142025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Faircloth, Jeremy, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128021491">http://www.sciencedirect.com/science/book/9780128021491</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coding for penetration testers : building better toolsent://SD_ILS/0/SD_ILS:4592172025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Andress, Jason, author. Linn, Ryan, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128054727">http://www.sciencedirect.com/science/book/9780128054727</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedingsent://SD_ILS/0/SD_ILS:5184852025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational approaches to studying the co-evolution of networks and behavior in social dilemmasent://SD_ILS/0/SD_ILS:3417432025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Corten, Rense, author.<br/>Yer Numarası ONLINE(341743.1)<br/>Elektronik Erişim Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118636879.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118636879.jpg</a>
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MyiLibrary <a href="http://www.myilibrary.com?id=571625">http://www.myilibrary.com?id=571625</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Conducting network penetration and espionage in a global environmentent://SD_ILS/0/SD_ILS:5411632025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Middleton, Bruce, 1953, author.<br/>Yer Numarası TK5105.59 .M53 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482206487">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>CISO's guide to penetration testing : a framework to plan, manage, and maximize benefitsent://SD_ILS/0/SD_ILS:5451612025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Tiller, James S., author.<br/>Yer Numarası QA76.9 .A25 T56 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439880289">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>An introduction to TTCN-3ent://SD_ILS/0/SD_ILS:2987922025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Willcock, Colin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470977903">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Penetration tester's open source toolkitent://SD_ILS/0/SD_ILS:1482252025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Faircloth, Jeremy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781597496278">http://www.sciencedirect.com/science/book/9781597496278</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coding for penetration testers building better toolsent://SD_ILS/0/SD_ILS:1487852025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Andress, Jason. Linn, Ryan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781597497299">http://www.sciencedirect.com/science/book/9781597497299</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer technology and computer programming : new research and strategiesent://SD_ILS/0/SD_ILS:5407182025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Antonakos, James L.<br/>Yer Numarası QA76.6 .C66 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466562592">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronicsent://SD_ILS/0/SD_ILS:5474892025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The ethical hack : a framework for business value penetration testingent://SD_ILS/0/SD_ILS:5462622025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Tiller, James S., author.<br/>Yer Numarası TK5105.59 .T55 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135502485">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The Computer Engineering Handbook.ent://SD_ILS/0/SD_ILS:5438382025-12-31T11:24:26Z2025-12-31T11:24:26ZYazar Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Yer Numarası TK7885 .C645 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
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