Arama Sonu&ccedil;lar&#305; Computer programs -- Testing. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bprograms$002b--$002bTesting.$0026ic$003dtrue$0026ps$003d300?dt=list 2025-12-06T10:19:13Z Code generation, analysis tools, and testing for quality ent://SD_ILS/0/SD_ILS:481998 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Queiros, Ricardo Alexandre Peixoto de, 1975- editor.&#160;Simoes, Alberto, 1978- editor.&#160;Pinto, Mario Teixeira, 1967- editor.&#160;IGI Global, publisher.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Chapter PDFs via platform: <a href="http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-5225-7455-2">http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-5225-7455-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Very Soft Organic Clay Applied for Road Embankment : Modelling and Optimisation Approach, UNESCO-IHE PhD, Delft, the Netherlands. ent://SD_ILS/0/SD_ILS:542698 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Limsiri, C., author.&#160;CRC Press LLC.<br/>Yer Numaras&#305;&#160;TE210.8<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429094125">https://www.taylorfrancis.com/books/9780429094125</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer technology and computer programming : new research and strategies ent://SD_ILS/0/SD_ILS:540718 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Antonakos, James L.<br/>Yer Numaras&#305;&#160;QA76.6 .C66 2011<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466562592">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Automated defect prevention best practices in software management ent://SD_ILS/0/SD_ILS:249514 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Huizinga, Dorota.&#160;Kolawa, Adam.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201515">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201515</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Pragmatic unit testing in Java with JUnit ent://SD_ILS/0/SD_ILS:101969 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Hunt, Andrew.&#160;Thomas, David.<br/>Yer Numaras&#305;&#160;QA76.6 .H8575 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~3<br/> The spin model checker : primer and reference manual ent://SD_ILS/0/SD_ILS:312840 2025-12-06T10:19:13Z 2025-12-06T10:19:13Z Yazar&#160;Holzmann, Gerard J.<br/>Yer Numaras&#305;&#160;TA168 H65 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/>