Arama Sonuçları Computer software -- Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsoftware$002b--$002bReliability.$0026ps$003d300?2024-11-13T13:46:51ZInternet of Things, Smart Spaces, and Next Generation Networks and Systems 22nd International Conference, NEW2AN 2022, Tashkent, Uzbekistan, December 15-16, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5208392024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Koucheryavy, Yevgeni. editor. (orcid) Aziz, Ahmed. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520839.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30258-9">https://doi.org/10.1007/978-3-031-30258-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer system reliability safety and usabilityent://SD_ILS/0/SD_ILS:2853902024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Dhillon, B. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:2493832024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:2907992024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Merkow, Mark S. Raghavan, Lakshmikanth.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439866221">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Model-Based Requirements Engineeringent://SD_ILS/0/SD_ILS:2478742024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Holt, Jon Perry, Simon A Brownsword, Mike<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPC009E">http://dx.doi.org/10.1049/PBPC009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied software measurement global analysis of productivity and qualityent://SD_ILS/0/SD_ILS:2933302024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Jones, Capers.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software developmentent://SD_ILS/0/SD_ILS:2907142024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Merkow, Mark S. Raghavan, Lakshmikanth.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439826973">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Systems and software engineering with applicationsent://SD_ILS/0/SD_ILS:2498132024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Huang, J. C., 1935-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332960">http://site.ebrary.com/lib/alltitles/Doc?id=10332960</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Using aspect-oriented programming for trustworthy software developmentent://SD_ILS/0/SD_ILS:2976242024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Safonov, V. O. (Vladimir Olegovich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=26061">http://www.books24x7.com/marc.asp?bookid=26061</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470283110">http://dx.doi.org/10.1002/9780470283110</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=138149&ref=toc">http://www.myilibrary.com?id=138149&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html">http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trustworthy computing analytical and quantitative engineering evaluationent://SD_ILS/0/SD_ILS:2969572024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Sahinoglu, Mehmet, 1951- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html">http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470127872">http://dx.doi.org/10.1002/9780470127872</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trustworthy systems through quantitative software engineeringent://SD_ILS/0/SD_ILS:2494372024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software safety and reliability : techniques, approaches, and standards of key industrial sectorsent://SD_ILS/0/SD_ILS:1130082024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Herrmann, Debra S.<br/>Yer Numarası QA76.76.R44 H39 1999<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>SafeWare : system safety and computersent://SD_ILS/0/SD_ILS:887882024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Leveson, Nancy.<br/>Yer Numarası QA 76.76.R44 L48 1995<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Ensuring software reliabilityent://SD_ILS/0/SD_ILS:2897932024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Neufelder, Ann Marie, 1960-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Control of Real-Time Processesent://SD_ILS/0/SD_ILS:2476982024-11-13T13:46:51Z2024-11-13T13:46:51ZYazar Bennett, S., ed. Virk, G. S., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCE041E">http://dx.doi.org/10.1049/PBCE041E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>