Arama Sonuçları Computer software -- Testing -- Data processing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsoftware$002b--$002bTesting$002b--$002bData$002bprocessing.$0026ps$003d300?dt=list
2025-12-06T07:26:42Z
Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part III
ent://SD_ILS/0/SD_ILS:520246
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2449-3">https://doi.org/10.1007/978-981-99-2449-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The 2021 International Conference on Smart Technologies and Systems for Internet of Things STSIoT2021
ent://SD_ILS/0/SD_ILS:527378
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Ahmad, Ishfaq. editor. Ye, Jun. editor. Liu, Weidong. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3632-6">https://doi.org/10.1007/978-981-19-3632-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Electrical Engineering Handbook - Six Volume Set
ent://SD_ILS/0/SD_ILS:542484
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedings
ent://SD_ILS/0/SD_ILS:518485
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Leveraging the wisdom of the crowd in software testing
ent://SD_ILS/0/SD_ILS:539181
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Sharma, Mukesh (Software testing engineer), author. Padmanaban, Rajini, author.<br/>Yer Numarası QA76.76 .T48 S53 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482254495">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Computer Engineering Handbook.
ent://SD_ILS/0/SD_ILS:543838
2025-12-06T07:26:42Z
2025-12-06T07:26:42Z
Yazar Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Yer Numarası TK7885 .C645 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>