Arama Sonu&ccedil;lar&#305; Computer software -- Testing. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsoftware$002b--$002bTesting.$0026ps$003d300?dt=list 2025-12-06T23:05:15Z Testing computer software ent://SD_ILS/0/SD_ILS:94677 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Kaner, Cem.&#160;Falk, Jack L., ort. yaz.&#160;Nguyen, Hung Quoc, ort. yaz.<br/>Yer Numaras&#305;&#160;QA 76.76.T48 K36 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part III ent://SD_ILS/0/SD_ILS:520246 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Hong, Wenxing. editor.&#160;Weng, Yang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-99-2449-3">https://doi.org/10.1007/978-981-99-2449-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part II ent://SD_ILS/0/SD_ILS:520264 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Jan, Mian Ahmad. editor.&#160;Khan, Fazlullah. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-23947-2">https://doi.org/10.1007/978-3-031-23947-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The 2021 International Conference on Smart Technologies and Systems for Internet of Things STSIoT2021 ent://SD_ILS/0/SD_ILS:527378 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Ahmad, Ishfaq. editor.&#160;Ye, Jun. editor.&#160;Liu, Weidong. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-19-3632-6">https://doi.org/10.1007/978-981-19-3632-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Yaz&#305;l&#305;m test rehberi ent://SD_ILS/0/SD_ILS:514358 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Bozkurt, Asiye&#160;&Ccedil;&uuml;&ccedil;en, Adem, author&#160;Ad&#305;g&uuml;zel, Ahmet, author<br/>Yer Numaras&#305;&#160;QA76.76.T48 B69 2022<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;R857 .B54<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> How to Reduce the Cost of Software Testing ent://SD_ILS/0/SD_ILS:539445 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Heusser, Matthew, editor.&#160;Kulkarni, Govind, editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;QA76.76 .T48<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315169484">Click here to view</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ESSENTIAL SOFTWARE TESTING : a use-case approach. ent://SD_ILS/0/SD_ILS:546819 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;FOURNIER, GREG.<br/>Yer Numaras&#305;&#160;QA76.76 .T48<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429114854">https://www.taylorfrancis.com/books/e/9780429114854</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429114854">https://www.taylorfrancis.com/books/9780429114854</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Yaz&#305;l&#305;m test rehberi ent://SD_ILS/0/SD_ILS:379345 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Bozkurt, Asiye&#160;&Ccedil;&uuml;&ccedil;en, Adem, author&#160;Ad&#305;g&uuml;zel, Ahmet, author<br/>Yer Numaras&#305;&#160;QA76.76.T48 B69 2016<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Software and System Development using Virtual Platforms Full-System Simulation with Wind River Simics. ent://SD_ILS/0/SD_ILS:355554 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Aarno, Daniel.&#160;Engblom, Jakob.<br/>Yer Numaras&#305;&#160;ONLINE(355554.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007259">http://www.sciencedirect.com/science/book/9780128007259</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedings ent://SD_ILS/0/SD_ILS:518485 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Fujita, Hamido. editor. (orcid)&#160;Guizzi, Guido. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Leveraging the wisdom of the crowd in software testing ent://SD_ILS/0/SD_ILS:539181 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Sharma, Mukesh (Software testing engineer), author.&#160;Padmanaban, Rajini, author.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 S53 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482254495">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of bioequivalence testing ent://SD_ILS/0/SD_ILS:546106 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Niazi, Sarfaraz, 1949, author.<br/>Yer Numaras&#305;&#160;RM301.45 .N53 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482226386">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Conducting network penetration and espionage in a global environment ent://SD_ILS/0/SD_ILS:541163 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Middleton, Bruce, 1953, author.<br/>Yer Numaras&#305;&#160;TK5105.59 .M53 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482206487">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Secure and resilient software : requirements, test cases, and testing methods ent://SD_ILS/0/SD_ILS:540156 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Merkow, Mark S., author.&#160;Raghavan, Lakshmikanth.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 M47 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439866221">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The basics of hacking and penetration testing ethical hacking and penetration testing made easy ent://SD_ILS/0/SD_ILS:145199 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Engebretson, Pat (Patrick Henry), 1974-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781597496551">http://www.sciencedirect.com/science/book/9781597496551</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software testing as a service ent://SD_ILS/0/SD_ILS:543649 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Ahmed, Ashfaque., author.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 A53 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420099577">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software error detection through testing and analysis ent://SD_ILS/0/SD_ILS:297725 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Huang, J. C., 1935-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332960">http://site.ebrary.com/lib/alltitles/Doc?id=10332960</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software testing and quality assurance theory and practice ent://SD_ILS/0/SD_ILS:297638 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Naik, Kshirasagar, 1959-&#160;Tripathy, Priyadarshi, 1958-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470382844">http://dx.doi.org/10.1002/9780470382844</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Foundations of software testing : fundamental algorithms and techniques : an undergraduate and graduate text, a reference for the practicing software engineer ent://SD_ILS/0/SD_ILS:133938 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Mathur, Aditya P.<br/>Yer Numaras&#305;&#160;QA76.76.T48 M38 2008<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Software testing and continuous quality improvement ent://SD_ILS/0/SD_ILS:543444 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Lewis, William E., author.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 L495 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439834367">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Manage software testing ent://SD_ILS/0/SD_ILS:546651 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Farrell-Vinay, Peter., author.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 F37 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420013849">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software testing testing across the entire software development life cycle ent://SD_ILS/0/SD_ILS:249509 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Everett, Gerald D., 1943-&#160;McLeod, Raymond.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Validation and qualification in analytical laboratories ent://SD_ILS/0/SD_ILS:109135 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Huber, Ludwig, 1948-<br/>Yer Numaras&#305;&#160;QV 744 H877 2007<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Practical model-based testing a tools approach ent://SD_ILS/0/SD_ILS:112191 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Utting, Mark.&#160;Legeard, Bruno.&#160;ScienceDirect (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical model-based testing a tools approach ent://SD_ILS/0/SD_ILS:147201 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Utting, Mark.&#160;Legeard, Bruno.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">http://www.sciencedirect.com/science/book/9780123725011</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The human-computer interaction handbook : fundamentals, evolving technologies, and emerging applications ent://SD_ILS/0/SD_ILS:539122 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Sears, Andrew.&#160;Jacko, Julie A.<br/>Yer Numaras&#305;&#160;QA76.9 .H85 H8568 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781410615862">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Validation and qualification in analytical laboratories ent://SD_ILS/0/SD_ILS:545190 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Huber, Ludwig, 1948- author.<br/>Yer Numaras&#305;&#160;QD75.4 .Q34 H83 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9780849382680">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing code security ent://SD_ILS/0/SD_ILS:546167 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Van der Linden, Maura A., author.<br/>Yer Numaras&#305;&#160;QA76.9 .A25 V359 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420013795">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of bioequivalence testing ent://SD_ILS/0/SD_ILS:545978 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Niazi, Sarfaraz, 1949- author.<br/>Yer Numaras&#305;&#160;RM301.45 .N53 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9780849383595">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software testing ent://SD_ILS/0/SD_ILS:112034 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Patton, Ron.<br/>Yer Numaras&#305;&#160;QA76.76.T48 P38 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Microelectronics ent://SD_ILS/0/SD_ILS:547489 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Whitaker, Jerry C.<br/>Yer Numaras&#305;&#160;TK7874 .M4587 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software quality engineering Testing, quality assurance, and quantifiable improvement ent://SD_ILS/0/SD_ILS:249464 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Tian, Jeff.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988897">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988897</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> How to break software : a practical guide to testing : an example-rich explanation of how to effectively test software that anyone can understand and use immediately ent://SD_ILS/0/SD_ILS:96797 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Whittaker, James A., 1965-<br/>Yer Numaras&#305;&#160;QA 76.76.T48 W47 2002<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Software testing and continuous quality improvement ent://SD_ILS/0/SD_ILS:541270 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Lewis, William E., author.&#160;Veerapillai, Gunasekaran.<br/>Yer 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Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Exploiting software : how to break code ent://SD_ILS/0/SD_ILS:96556 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Hoglund, Greg.&#160;McGraw, Gary, 1966- ort. yaz.<br/>Yer Numaras&#305;&#160;QA 76.9.A25 H635 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Critical testing processes : plan, prepare, perform, perfect ent://SD_ILS/0/SD_ILS:103868 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Black, Rex, 1964-<br/>Yer Numaras&#305;&#160;QA 76.76.T48 B552 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> How to break software security : effective technigues for security testing ent://SD_ILS/0/SD_ILS:105584 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Whittaker, James A., 1965-&#160;Thomson, Herbert H., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 76.9.A25 W48 2004<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> A 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(Rick David), 1955-&#160;Jaskiel, Stefan P., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 76.76.T48 C73 2002<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Lessons learned in software testing : a context-driven approach ent://SD_ILS/0/SD_ILS:96377 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Kaner, Cem.&#160;Bach, James. ort. yaz.&#160;Pettichord, Bret. ort. yaz.<br/>Yer Numaras&#305;&#160;QA 76.76.T48 K34 2002<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Effective software testing : 50 specific ways to improve your testing ent://SD_ILS/0/SD_ILS:105112 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Dustin, Elfriede.<br/>Yer Numaras&#305;&#160;QA 76.76.T48 D873 2002<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> The Computer Engineering Handbook. ent://SD_ILS/0/SD_ILS:543838 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Oklobdzija, Vojin G., author.&#160;CRC Press LLC.<br/>Yer Numaras&#305;&#160;TK7885 .C645 2002<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing IT : an off-the-shelf software testing process ent://SD_ILS/0/SD_ILS:106056 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Watkins, John (John Edward)<br/>Yer Numaras&#305;&#160;QA 76.76.T48 W38 2001<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Testing object-oriented systems : models, patterns, and tools ent://SD_ILS/0/SD_ILS:112805 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Binder, Robert V.<br/>Yer Numaras&#305;&#160;QA76.64 B56 2000<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Software testing and continuous quality improvement ent://SD_ILS/0/SD_ILS:545947 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Lewis, William E., author.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 L495 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420048124">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Automated software testing : introduction, management, and performance ent://SD_ILS/0/SD_ILS:108120 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Dustin, Elfriede.&#160;Rashka, Jeff.&#160;Paul, John.<br/>Yer Numaras&#305;&#160;QA76.76.T48 D87 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> PDCA/Test : a quality tool framework for software testing ent://SD_ILS/0/SD_ILS:543927 2025-12-06T23:05:15Z 2025-12-06T23:05:15Z Yazar&#160;Lewis, William E.<br/>Yer Numaras&#305;&#160;QA76.76 .T48 L49 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429131769">https://www.taylorfrancis.com/books/9780429131769</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>