Arama Sonuçları Computer software -- Testing. - Daraltılmış: Çevrimiçi KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsoftware$002b--$002bTesting.$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253AONLINE$002509$0025C3$002587evrimi$0025C3$0025A7i$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ic$003dtrue$0026ps$003d300?dt=list2025-12-07T11:00:46ZComputer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIIent://SD_ILS/0/SD_ILS:5202462025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2449-3">https://doi.org/10.1007/978-981-99-2449-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5202642025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23947-2">https://doi.org/10.1007/978-3-031-23947-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The 2021 International Conference on Smart Technologies and Systems for Internet of Things STSIoT2021ent://SD_ILS/0/SD_ILS:5273782025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Ahmad, Ishfaq. editor. Ye, Jun. editor. Liu, Weidong. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3632-6">https://doi.org/10.1007/978-981-19-3632-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reduce the Cost of Software Testingent://SD_ILS/0/SD_ILS:5394452025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Heusser, Matthew, editor. Kulkarni, Govind, editor. Taylor and Francis.<br/>Yer Numarası QA76.76 .T48<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315169484">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>ESSENTIAL SOFTWARE TESTING : a use-case approach.ent://SD_ILS/0/SD_ILS:5468192025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar FOURNIER, GREG.<br/>Yer Numarası QA76.76 .T48<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429114854">https://www.taylorfrancis.com/books/e/9780429114854</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429114854">https://www.taylorfrancis.com/books/9780429114854</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software and System Development using Virtual Platforms Full-System Simulation with Wind River Simics.ent://SD_ILS/0/SD_ILS:3555542025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Aarno, Daniel. Engblom, Jakob.<br/>Yer Numarası ONLINE(355554.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007259">http://www.sciencedirect.com/science/book/9780128007259</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedingsent://SD_ILS/0/SD_ILS:5184852025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Leveraging the wisdom of the crowd in software testingent://SD_ILS/0/SD_ILS:5391812025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Sharma, Mukesh (Software testing engineer), author. Padmanaban, Rajini, author.<br/>Yer Numarası QA76.76 .T48 S53 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482254495">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of bioequivalence testingent://SD_ILS/0/SD_ILS:5461062025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Niazi, Sarfaraz, 1949, author.<br/>Yer Numarası RM301.45 .N53 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482226386">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Conducting network penetration and espionage in a global environmentent://SD_ILS/0/SD_ILS:5411632025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Middleton, Bruce, 1953, author.<br/>Yer Numarası TK5105.59 .M53 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482206487">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software : requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:5401562025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Merkow, Mark S., author. Raghavan, Lakshmikanth.<br/>Yer Numarası QA76.76 .T48 M47 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439866221">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The basics of hacking and penetration testing ethical hacking and penetration testing made easyent://SD_ILS/0/SD_ILS:1451992025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Engebretson, Pat (Patrick Henry), 1974-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781597496551">http://www.sciencedirect.com/science/book/9781597496551</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing as a serviceent://SD_ILS/0/SD_ILS:5436492025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Ahmed, Ashfaque., author.<br/>Yer Numarası QA76.76 .T48 A53 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420099577">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Huang, J. C., 1935-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing and quality assurance theory and practiceent://SD_ILS/0/SD_ILS:2976382025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Naik, Kshirasagar, 1959- Tripathy, Priyadarshi, 1958- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470382844">http://dx.doi.org/10.1002/9780470382844</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing and continuous quality improvementent://SD_ILS/0/SD_ILS:5434442025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Lewis, William E., author.<br/>Yer Numarası QA76.76 .T48 L495 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439834367">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Manage software testingent://SD_ILS/0/SD_ILS:5466512025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Farrell-Vinay, Peter., author.<br/>Yer Numarası QA76.76 .T48 F37 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420013849">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing testing across the entire software development life cycleent://SD_ILS/0/SD_ILS:2495092025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Everett, Gerald D., 1943- McLeod, Raymond. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical model-based testing a tools approachent://SD_ILS/0/SD_ILS:1121912025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Utting, Mark. Legeard, Bruno. ScienceDirect (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical model-based testing a tools approachent://SD_ILS/0/SD_ILS:1472012025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Utting, Mark. Legeard, Bruno.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123725011">http://www.sciencedirect.com/science/book/9780123725011</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The human-computer interaction handbook : fundamentals, evolving technologies, and emerging applicationsent://SD_ILS/0/SD_ILS:5391222025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Sears, Andrew. Jacko, Julie A.<br/>Yer Numarası QA76.9 .H85 H8568 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781410615862">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Validation and qualification in analytical laboratoriesent://SD_ILS/0/SD_ILS:5451902025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Huber, Ludwig, 1948- author.<br/>Yer Numarası QD75.4 .Q34 H83 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9780849382680">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing code securityent://SD_ILS/0/SD_ILS:5461672025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Van der Linden, Maura A., author.<br/>Yer Numarası QA76.9 .A25 V359 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420013795">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of bioequivalence testingent://SD_ILS/0/SD_ILS:5459782025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Niazi, Sarfaraz, 1949- author.<br/>Yer Numarası RM301.45 .N53 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9780849383595">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronicsent://SD_ILS/0/SD_ILS:5474892025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Software quality engineering Testing, quality assurance, and quantifiable improvementent://SD_ILS/0/SD_ILS:2494642025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Tian, Jeff. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988897">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988897</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing and continuous quality improvementent://SD_ILS/0/SD_ILS:5412702025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Lewis, William E., author. Veerapillai, Gunasekaran.<br/>Yer Numarası QA76.76 .T48 L495 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135485962">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Vibration and shock handbookent://SD_ILS/0/SD_ILS:5439042025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar De Silva, Clarence W.<br/>Yer Numarası TA355 .V5197 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420039894">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The art of software testingent://SD_ILS/0/SD_ILS:1529872025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Myers, Glenford J., 1946- Badgett, Tom. Thomas, Todd M. Sandler, Corey, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=114566">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=114566</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>21 CFR Part 11 : complete guide to international computer validation compliance for the pharmaceutical industryent://SD_ILS/0/SD_ILS:5442982025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar López, Orlando., author.<br/>Yer Numarası RS192 .L67 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135488765">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Unit testing in Java how tests drive the codeent://SD_ILS/0/SD_ILS:2536582025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Link, Johannes. Frlich, Peter.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9781558608689">http://www.sciencedirect.com/science/book/9781558608689</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Computer Engineering Handbook.ent://SD_ILS/0/SD_ILS:5438382025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Yer Numarası TK7885 .C645 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing and continuous quality improvementent://SD_ILS/0/SD_ILS:5459472025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Lewis, William E., author.<br/>Yer Numarası QA76.76 .T48 L495 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420048124">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>PDCA/Test : a quality tool framework for software testingent://SD_ILS/0/SD_ILS:5439272025-12-07T11:00:46Z2025-12-07T11:00:46ZYazar Lewis, William E.<br/>Yer Numarası QA76.76 .T48 L49 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429131769">https://www.taylorfrancis.com/books/9780429131769</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>