Arama Sonuçları Computer software -- Testing. - Daraltılmış: Electronic books.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsoftware$002b--$002bTesting.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300?dt=list2025-12-07T01:40:46ZThe Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reduce the Cost of Software Testingent://SD_ILS/0/SD_ILS:5394452025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Heusser, Matthew, editor. Kulkarni, Govind, editor. Taylor and Francis.<br/>Yer Numarası QA76.76 .T48<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315169484">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Huang, J. C., 1935-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software testing testing across the entire software development life cycleent://SD_ILS/0/SD_ILS:2495092025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Everett, Gerald D., 1943- McLeod, Raymond. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unit testing in Java how tests drive the codeent://SD_ILS/0/SD_ILS:2536582025-12-07T01:40:46Z2025-12-07T01:40:46ZYazar Link, Johannes. Frlich, Peter.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9781558608689">http://www.sciencedirect.com/science/book/9781558608689</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>