Arama Sonu&ccedil;lar&#305; Computer systems -- Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bsystems$002b--$002bReliability.$0026ps$003d300$0026isd$003dtrue?dt=list 2025-12-08T04:24:18Z Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yer Numaras&#305;&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:305462 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Bauer, Eric.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of computer systems and networks fault tolerance, analysis and design ent://SD_ILS/0/SD_ILS:301466 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Shooman, Martin L.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Internet of Things, Smart Spaces, and Next Generation Networks and Systems 22nd International Conference, NEW2AN 2022, Tashkent, Uzbekistan, December 15-16, 2022, Proceedings ent://SD_ILS/0/SD_ILS:520839 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Koucheryavy, Yevgeni. editor. (orcid)&#160;Aziz, Ahmed. editor. (orcid)&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-30258-9">https://doi.org/10.1007/978-3-031-30258-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521137 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Schoitsch, Erwin. editor.&#160;Roy, Matthieu. editor.&#160;Bitsch, Friedemann. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;R857 .B54<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Self-Regulation in Activity Theory : Applied Work Design for Human-Computer and Human-Machine Systems ent://SD_ILS/0/SD_ILS:542182 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Bedny, Gregory Z., author.&#160;Karwowski, Waldemar, author.&#160;Bedny, Inna, author.<br/>Yer Numaras&#305;&#160;TA166 .B436 2018<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781466569355">https://www.taylorfrancis.com/books/e/9781466569355</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429188145">https://www.taylorfrancis.com/books/9780429188145</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems ent://SD_ILS/0/SD_ILS:529277 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Kadry, Seifedine. editor.&#160;El Hami, Abdelkhalak. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering ent://SD_ILS/0/SD_ILS:530615 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Sobh, Tarek. editor.&#160;Elleithy, Khaled. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Foundations of software and system performance engineering: process, performance modeling, requirements, testing, scalability, and practice ent://SD_ILS/0/SD_ILS:378304 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Bondi, Andr&eacute; B., author.<br/>Yer Numaras&#305;&#160;QA76.9.E94 B66 2015<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Open systems dependability : dependability engineering for ever-changing systems ent://SD_ILS/0/SD_ILS:546737 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Tokoro, Mario, 1947-<br/>Yer Numaras&#305;&#160;QA76.9 .F38 O64 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466577527">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer system reliability : safety and usability ent://SD_ILS/0/SD_ILS:547174 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dhillon, B. S., author.<br/>Yer Numaras&#305;&#160;QA76.76 .R44 D495 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466573130">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety of computer architectures ent://SD_ILS/0/SD_ILS:304132 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Boulanger, Jean-Louis.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://lib.myilibrary.com?id=450000">Connect to MyiLibrary resource.</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118600696">http://onlinelibrary.wiley.com/book/10.1002/9781118600696</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118600696">http://dx.doi.org/10.1002/9781118600696</a> ebrary <a href="http://site.ebrary.com/id/10657623">http://site.ebrary.com/id/10657623</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle costing for engineers ent://SD_ILS/0/SD_ILS:545696 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA177.7 .D348 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439816899">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;TA174 .E54 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault-tolerant systems ent://SD_ILS/0/SD_ILS:145713 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Koren, Israel, 1945-&#160;Krishna, C. M. (C. Mani)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885251">http://www.sciencedirect.com/science/book/9780120885251</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Trustworthy computing analytical and quantitative engineering evaluation ent://SD_ILS/0/SD_ILS:296957 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Sahinoglu, Mehmet, 1951-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html">http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470127872">http://dx.doi.org/10.1002/9780470127872</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault-tolerant systems ent://SD_ILS/0/SD_ILS:112168 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Koren, Israel, 1945-&#160;Krishna, C. M.&#160;ScienceDirect (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885251">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The engineering handbook ent://SD_ILS/0/SD_ILS:541498 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dorf, Richard C.<br/>Yer Numaras&#305;&#160;TA151 .E424 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420039870">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computers, Software Engineering, and Digital Devices ent://SD_ILS/0/SD_ILS:542493 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dorf, Richard C., author.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;TK7885<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The electronics handbook ent://SD_ILS/0/SD_ILS:546489 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Whitaker, Jerry C.<br/>Yer Numaras&#305;&#160;TK7867 .E4244 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420036664">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer systems performance evaluation and prediction ent://SD_ILS/0/SD_ILS:254063 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Fortier, Paul J.&#160;Michel, Howard Edgar.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781555582609">http://www.sciencedirect.com/science/book/9781555582609</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Occupational ergonomics : principles of work design ent://SD_ILS/0/SD_ILS:540269 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Karwowski, Waldemar, 1953-&#160;Marras, William S. (William Steven), 1952-<br/>Yer Numaras&#305;&#160;TA166 .O2565 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135497651">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2025-12-08T04:24:18Z 2025-12-08T04:24:18Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>