Arama Sonu&ccedil;lar&#305; Computer vision -- Congresses. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer$002bvision$002b--$002bCongresses.$0026ps$003d300?dt=list 2026-01-15T07:05:52Z Computer vision &amp; laser vibrometry, Vol. 6 ent://SD_ILS/0/SD_ILS:567989 2026-01-15T07:05:52Z 2026-01-15T07:05:52Z Yazar&#160;International Modal Analysis Conference (42nd : 2024)&#160;Baqersad, Javad, editor.&#160;Di Maio, Dario, editor.&#160;Rohe, Dan, editor.<br/>Yer Numaras&#305;&#160;TA1634 .I58 2024 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788743804277">https://www.taylorfrancis.com/books/9788743804277</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer vision &amp; laser vibrometry. Volume 6 ent://SD_ILS/0/SD_ILS:566034 2026-01-15T07:05:52Z 2026-01-15T07:05:52Z Yazar&#160;International Modal Analysis Conference (41st : 2023)&#160;Baqersad, Javad, editor.&#160;Di Maio, Dario, editor.<br/>Yer Numaras&#305;&#160;TA1634 .I58 2023 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788743804123">https://www.taylorfrancis.com/books/9788743804123</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany ent://SD_ILS/0/SD_ILS:78349 2026-01-15T07:05:52Z 2026-01-15T07:05:52Z Yazar&#160;Marszalec, Elzbieta A., ed.&#160;Trucco, Emanuele, ed.&#160;European Optical Society.&#160;Society of Photo-optical Instrumentation Engineers.<br/>Yer Numaras&#305;&#160;TS 156.2 P65 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Machine vision for inspection and measurement ent://SD_ILS/0/SD_ILS:256099 2026-01-15T07:05:52Z 2026-01-15T07:05:52Z Yazar&#160;Freeman, Herbert.&#160;Rutgers University. Center for Computer Aids for Industrial Productivity.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122667190">http://www.sciencedirect.com/science/book/9780122667190</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Machine vision algorithms, architectures, and systems ent://SD_ILS/0/SD_ILS:254984 2026-01-15T07:05:52Z 2026-01-15T07:05:52Z Yazar&#160;Freeman, Herbert.&#160;Rutgers University. Center for Computer Aids for Industrial Productivity.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122667206">http://www.sciencedirect.com/science/book/9780122667206</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>